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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Projekt, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	http://linked.opendata.cz/ontology/domain/vavai/Projekt
rdfs:seeAlso	http://www.isvav.cz/projectDetail.do?rowId=TE01020118
Description	The project aims at introducing in electron microscopes novel techniques responding to needs of nanotechnologies, development of advanced materials, and application of knowledge acquired in biology and medicine. This concerns imaging of crystals including 2D ones, non-conductive surfaces, imaging the wave-optical contrasts, etc. Novel materials, technologies of their processing and novel components of the scanning electron microscopes will be developed, accompanied with adequate methodology. (en) Projekt usiluje zavést do elektronových mikroskopů nové techniky odpovídající na potřeby nanotechnologií, vývoje pokročilých materiálů a aplikací nových poznatků biologie a medicíny. Jedná se o metody zobrazování krystalů včetně dvourozměrných, nevodivých povrchů, zobrazování pomocí vlnově optických kontrastů, aj. Budou vyvinuty nové materiály, technologie jejich zpracování a nové stavební prvky rastrovacích elektronových mikroskopů doprovázené odpovídající metodikou.
Title	Electron microscopy (en) Elektronová mikroskopie
skos:notation	TE01020118
http://linked.open...avai/cep/aktivita	Competence Centres
http://linked.open...kovaStatniPodpora	http://linked.opendata.cz/resource/domain/vavai/projekt/TE01020118/celkovaStatniPodpora
http://linked.open...ep/celkoveNaklady	http://linked.opendata.cz/resource/domain/vavai/projekt/TE01020118/celkoveNaklady
http://linked.open...datumDodatniDoRIV	2015-05-26 (xsd:date)
http://linked.open...i/cep/druhSouteze	VS - Veřejná soutěž ve výzkumu a vývoji
http://linked.open...ep/duvernostUdaju	C - Předmět podléhá obchodnímu tajemství (§17 až 20 Obchodního zákoníku), ale některé údaje jsou upraveny tak, aby byly zveřejnitelné
http://linked.open.../cep/fazeProjektu	100995313
http://linked.open...ai/cep/hlavniObor	JA - Elektronika a optoelektronika, elektrotechnika
http://linked.open...vai/cep/kategorie	AP - Aplikovaný výzkum
http://linked.open.../cep/klicovaSlova	electron microscopy, electron microscopy techniques, nanostructure of materials, nanostructure of living matter (en)
http://linked.open...ep/partnetrHlavni	FEI Czech Republic s.r.o.
http://linked.open...inujicichPrijemcu	0 (xsd:int)
http://linked.open...cep/pocetPrijemcu	1 (xsd:int)
http://linked.open...ocetSpoluPrijemcu	7 (xsd:int)
http://linked.open.../pocetVysledkuRIV	54 (xsd:int)
http://linked.open...enychVysledkuVRIV	54 (xsd:int)
http://linked.open...lneniVMinulemRoce	2014-03-04 (xsd:date)
http://linked.open.../prideleniPodpory	http://linked.opendata.cz/resource/domain/vavai/cep/prideleniPodpory/2012TE01020118
http://linked.open...iciPoslednihoRoku	2015
http://linked.open...atUdajeProjZameru	2015
http://linked.open.../vavai/cep/soutez	STA02012CK
http://linked.open...usZobrazovaneFaze	DRRVB
http://linked.open...ai/cep/typPojektu	P - Projekt výzkumu a vývoje financovaný ze státního rozpočtu
http://linked.open...ep/ukonceniReseni	2019-12-31 (xsd:date)
http://linked.open.../cep/vedlejsiObor	JA - Elektronika a optoelektronika, elektrotechnika EA - Morfologické obory a cytologie
http://linked.open...ep/zahajeniReseni	2012-03-01 (xsd:date)
http://linked.open...tniCyklusProjektu	ZBBB
http://linked.open.../cep/klicoveSlovo	electron microscopy electron microscopy techniques nanostructure of materials
is http://linked.open...vavai/riv/projekt of	Dynamic mechanical and dielectric properties of ethylene vinyl acetate/carbon nanotube composites Microstructural characterization of metallic materials using advanced SEM techniques Performance of SEM Scintillation Detector Evaluated by Modulation Transfer Function and Detective Quantum Efficiency Function Performance of YAG:Ce Scintillators for Low-Energy Electron Detectors in S(T)EM Low energy Scanning Transmission Electron Microscope Scanning Electron Microscopy With Slow Electrons A NEW APPROACH TO STUDYING CAST CB2 STEEL USING SLOW AND VERY SLOW ELECTRONS Analysis of electron current instability in E-beam writer Technology for preparation of YAG:Ce single crystal without slow decay components Study of spatial resolution of YAG:Ce cathodoluminescent imaging screens Very low energy electron microscopy of graphene flakes Infection and injury of human astrocytes by tick-borne encephalitis virus Innovation possibilities of scintillation electron detector for SEM Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM Simultaneous detection of multiple targets for ultrastructural immunocytochemistry Microstructure of Tool Steel X37CrMoV5 after Cryogenic Treatment and its Effect on Wear Resistance Influence of Microstructural Changes in Creep Resistant Steel after Long-term Creep Tests on the Shape of the Polarization Curves Imaging of tissue sections with very slow electrons Nop2 is expressed during proliferation of neural stem cells and in adult mouse and human brain Characterization of Yeast Biofilm by Cryo-SEM and FIB-SEM CATHOLD: Teplotně řízený držák vzorku pro měření katodoluminiscence Detektor prošlých elektronů pro in-situ SEM. Detektor umístěný v objektivové čočce rastrovacího elektronového mikroskopu. Electron microscopy in the Institute of Scientific Instruments AS CR Prototype of vacuum compatible sample holder for in-situ SEM. Ultrastructure of Ehrlichia mineirensis, a new member of the Ehrlichia genus TRIP steel microstructure visualized by slow and very slow electrons SEM, TEM and SLEEM (Scanning Low Energy Electron Microscopy) of CB2 Steel after Creep Testing Surface modification of low-density polyethylene with poly(2-ethyl-2-oxazoline) using a low-pressure plasma treatment Structure of polymeric nanoparticles in surfactant-stabilized aqueous dispersions of high-molar-mass hydrophobic graft copolymers Synthesis of photoactuating acrylic thermoplastic elastomers containing diblock copolymer-grafted carbon nanotubes Nano modification of the W(100)/ZrO electron emitter tip using reactive ion etching Modified knife-edge method for current density distribution measurements in e-beam writers CHANGES IN DISLOCATION SUBSTRUCTURE OF S235JR STEEL DURING FATIGUE LOADING Characterization of biodegradable polycaprolactone containing titanium dioxide micro and nanoparticles Scanning Electron Microscopy with Samples in an Electric Field Polyelectrolyte-surfactant complexes of poly[3,5-bis(dimethylaminomethyl)-4-hydroxystyrene]-block-poly(ethylene oxide) and sodium dodecyl sulfate: anomalous self-assembly behavior Apparatus for temperature-dependent cathodoluminescence characterization of materials Beam damage of embedding media sections and their investigations by SEM Phase photo masks produced by means of electron beam lithography and ion etching for Bragg gratings Exploitation of Contrasts in Low Energy SEM to Reveal True Microstructure Exposure Time Comparison between E-beam Writer with Gaussian Beam and Variable Shaped Beam Examination of Graphene with Very Slow Electrons Novel poly(ethylene oxide monomethyl ether)-b-poly(.epsilon.-caprolactone) diblock copolymers containing a pH-acid labile ketal group as a block linkage Cause of formation of Widmanstätten structure in carbon steel Viscoelastic and photo-actuation studies of composites based on polystyrene-grafted carbon nanotubes and styrene-b-isoprene-b-styrene block copolymer Comparison of freeze fracture images of mixed bacterial/yeast biofilm in cryo-SEM with high pressure freezing fixation Cryo-SEM of Perpendicular Cross Freeze-Fractures Through a High-Pressure-frozen Biofilm Poly(N-isopropyl acrylamide)-block-poly(n-butyl acrylate) thermoresponsive amphiphilic copolymers: Synthesis, characterization and self-assembly behavior in aqueous solutions Polymer surface morphology: characterization by electron microscopies Characterization of .beta.-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques In situ WetSTEM observation of gold nanorod self-assembly dynamics in a drying colloidal droplet Measurement of current density distribution in shaped e-beam writers Ultra-low-energy STEM in SEM
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