About: Scanning Electron Microscopy with Samples in an Electric Field

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The high negative bias of a sample in a scanning electron microscope constitutes the “cathode lens with a strong electric field just above the sample surface. This mode offers a convenient tool for controlling the landing energy of electrons down to units or even fractions of electronvolts with only slight readjustments of the column. Moreover, the field accelerates and collimates the signal electrons to earthed detectors above and below the sample, thereby assuring high collection efficiency and high amplification of the image signal. One important feature is the ability to acquire the complete emission of the backscattered electrons, including those emitted at high angles with respect to the surface normal. The cathode lens aberrations are proportional to the landing energy of electrons so the spot size becomes nearly constant throughout the full energy scale. At low energies and with their complete angular distribution acquired, the backscattered electron images offer enhanced information about crystalline and electronic structures thanks to contrast mechanisms that are otherwise unavailable. Examples from various areas of materials science are presented. The high negative bias of a sample in a scanning electron microscope constitutes the “cathode lens with a strong electric field just above the sample surface. This mode offers a convenient tool for controlling the landing energy of electrons down to units or even fractions of electronvolts with only slight readjustments of the column. Moreover, the field accelerates and collimates the signal electrons to earthed detectors above and below the sample, thereby assuring high collection efficiency and high amplification of the image signal. One important feature is the ability to acquire the complete emission of the backscattered electrons, including those emitted at high angles with respect to the surface normal. The cathode lens aberrations are proportional to the landing energy of electrons so the spot size becomes nearly constant throughout the full energy scale. At low energies and with their complete angular distribution acquired, the backscattered electron images offer enhanced information about crystalline and electronic structures thanks to contrast mechanisms that are otherwise unavailable. Examples from various areas of materials science are presented. (en)
Title	Scanning Electron Microscopy with Samples in an Electric Field Scanning Electron Microscopy with Samples in an Electric Field (en)
skos:prefLabel	Scanning Electron Microscopy with Samples in an Electric Field Scanning Electron Microscopy with Samples in an Electric Field (en)
skos:notation	RIV/68081731:_____/12:00385193!RIV13-GA0-68081731
http://linked.open...avai/predkladatel	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(ED0017/01/01), P(GAP108/11/2270), P(TE01020118)
http://linked.open...iv/cisloPeriodika	12
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Hovorka, Miloš Müllerová, Ilona Mikmeková, Šárka Frank, Luděk Mikmeková, Eliška Pokorná, Zuzana
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	166800
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/12:00385193
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	scanning electron microscopy; slow electrons; low energy SEM; low energy STEM; cathode lens (en)
http://linked.open.../riv/klicoveSlovo	slow electrons cathode lens scanning electron microscopy low energy SEM low energy STEM
http://linked.open...odStatuVydavatele	CH - Švýcarská konfederace
http://linked.open...ontrolniKodProRIV	[4FD6DFAAEF1E]
http://linked.open...i/riv/nazevZdroje	Materials
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	6 (xsd:int)
http://linked.open...cetTvurcuVysledku	6 (xsd:int)
http://linked.open...vavai/riv/projekt	Mapping of the local crystallinic structure by backscattered electrons Electron microscopy APPLICATION LABORATORIES OF ADVANCED MICROTECHNOLOGIES AND NANOTECHNOLOGIES
http://linked.open...UplatneniVysledku	2012
http://linked.open...v/svazekPeriodika	5
http://linked.open...iv/tvurceVysledku	Mikmeková, Šárka Mikmeková, Eliška Hovorka, Miloš Müllerová, Ilona Frank, Luděk Pokorná, Zuzana
http://linked.open...ain/vavai/riv/wos	000312608500016
issn	1996-1944
number of pages	26 (xsd:int)
http://bibframe.org/vocab/doi	10.3390/ma5122731
is http://linked.open...avai/riv/vysledek of	Scanning Electron Microscopy with Samples in an Electric Field

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