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rdf:type
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Description
| - RF and DC plasma jet sputtering systems were investigated as sources for deposition of ZnO thin films. Deposited zone films have a strong orientation of hexagonal crystallites with the 'c' axis perpendicular to the substrate surface. Temperature of the substrate did not exceed 150 °C during the deposition. Langmuir probe measurement performed at the substrate revealed two groups of electrons with different temperatures in the DC plasma jet. A single group of electrons was found in the RF plasma jet system. Electron concentration in the RF jet was found to be about neRF ? 5 ? 109 1010 cm-3 with temperature TeRF ? 2.53.5 eV. In the DC plasma jet, concentration of cold electrons was usually nec ? 109 cm-3 with temperature Tec ? 0.5 eV and concentration of hot electrons was neh ? 108 cm-3 with temperature Teh ? 23.5 eV. Photographs also confirmed that the plasma density is higher in the position of the substrate in the RF jet than in the DC jet.
- RF and DC plasma jet sputtering systems were investigated as sources for deposition of ZnO thin films. Deposited zone films have a strong orientation of hexagonal crystallites with the 'c' axis perpendicular to the substrate surface. Temperature of the substrate did not exceed 150 °C during the deposition. Langmuir probe measurement performed at the substrate revealed two groups of electrons with different temperatures in the DC plasma jet. A single group of electrons was found in the RF plasma jet system. Electron concentration in the RF jet was found to be about neRF ? 5 ? 109 1010 cm-3 with temperature TeRF ? 2.53.5 eV. In the DC plasma jet, concentration of cold electrons was usually nec ? 109 cm-3 with temperature Tec ? 0.5 eV and concentration of hot electrons was neh ? 108 cm-3 with temperature Teh ? 23.5 eV. Photographs also confirmed that the plasma density is higher in the position of the substrate in the RF jet than in the DC jet. (en)
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Title
| - Investigation of RF and DC plasma jet system during deposition of highly oriented ZnO thin films
- Investigation of RF and DC plasma jet system during deposition of highly oriented ZnO thin films (en)
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skos:prefLabel
| - Investigation of RF and DC plasma jet system during deposition of highly oriented ZnO thin films
- Investigation of RF and DC plasma jet system during deposition of highly oriented ZnO thin films (en)
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skos:notation
| - RIV/68407700:21340/03:04092460!RIV/2004/MSM/213404/N
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http://linked.open.../vavai/riv/strany
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(GA202/00/1592), P(GP202/02/P021), P(LN00A015), P(ME 441), Z(AV0Z1010914), Z(MSM 113200002), Z(MSM 210000022)
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68407700:21340/03:04092460
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - Plasma jet; ZnO thin films; Langmuir probe; Hollow cathode discharge (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Surface and Coatings Technology
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Jastrabík, L.
- Ptáček, Pavel
- Hubička, Z.
- Adámek, P.
- Čada, M.
- Šícha, M.
- Šíchová, H.
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http://linked.open...n/vavai/riv/zamer
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issn
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number of pages
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http://localhost/t...ganizacniJednotka
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