About: Test Patterns Compression Technique Based on a Dedicated SAT-Based ATPG

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Test Patterns Compression Technique Based on a Dedicated SAT-Based ATPG Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method is targeted to systems on chip (SoCs) provided with the P1500 test standard. The RESPIN architecture can be used for test patterns decompression. The main idea is based on finding the best overlap of test patterns during the test generation, unlike other methods, which are based on efficient overlapping of pre-generated test patterns. The proposed algorithm takes advantage of an implicit test representation as SAT problem instances. The results of test patterns compression obtained for standard ISCAS'85 and '89 benchmark circuits are shown and compared with competitive test compression methods. In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method is targeted to systems on chip (SoCs) provided with the P1500 test standard. The RESPIN architecture can be used for test patterns decompression. The main idea is based on finding the best overlap of test patterns during the test generation, unlike other methods, which are based on efficient overlapping of pre-generated test patterns. The proposed algorithm takes advantage of an implicit test representation as SAT problem instances. The results of test patterns compression obtained for standard ISCAS'85 and '89 benchmark circuits are shown and compared with competitive test compression methods. (en)
Title	Test Patterns Compression Technique Based on a Dedicated SAT-Based ATPG Test Patterns Compression Technique Based on a Dedicated SAT-Based ATPG (en)
skos:prefLabel	Test Patterns Compression Technique Based on a Dedicated SAT-Based ATPG Test Patterns Compression Technique Based on a Dedicated SAT-Based ATPG (en)
skos:notation	RIV/68407700:21240/10:00169351!RIV11-GA0-21240___
http://linked.open...avai/riv/aktivita	P S Z
http://linked.open...avai/riv/aktivity	P(GA102/09/1668), S, Z(MSM6840770014)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Fišer, Petr Schmidt, Jan Balcárek, Jiří
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Fakulta informačních technologií
http://linked.open...dnocenehoVysledku	292441
http://linked.open...ai/riv/idVysledku	RIV/68407700:21240/10:00169351
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Test patterns compression, testing, ATPG, SAT (en)
http://linked.open.../riv/klicoveSlovo	Test patterns compression SAT testing ATPG
http://linked.open...ontrolniKodProRIV	[FA9DF5373285]
http://linked.open...v/mistoKonaniAkce	Lille
http://linked.open...i/riv/mistoVydani	Los Alamitos
http://linked.open...i/riv/nazevZdroje	Proceedings of the 13th Euromicro Conference on Digital System Design
http://linked.open...in/vavai/riv/obor	JC
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	SoC circuits reliability and availability improvement
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Balcárek, Jiří Fišer, Petr Schmidt, Jan
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2010-09-01 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Výzkum perspektivních informačních a komunikačních technologií
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	IEEE Computer Society Press
https://schema.org/isbn	978-0-7695-4171-6
http://localhost/t...ganizacniJednotka	21240
is http://linked.open...avai/riv/vysledek of	Test Patterns Compression Technique Based on a Dedicated SAT-Based ATPG

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 58 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software