About: Scan Based Circuits with Low Power Consumption

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In this paper we present a low power scan design method. In order to maximize power savings and minimize the hardware overhead we have proposed a modified RAS diagnostic access method, which can be used together with the BS. In this paper we present a low power scan design method. In order to maximize power savings and minimize the hardware overhead we have proposed a modified RAS diagnostic access method, which can be used together with the BS. (en) Elánek popisuje novou diagnostickou metodu zalo3enou na principu RAS. Nová metoda umo3ouje sní3it spotoebu energie poi testování. (cs)
Title	Scan Based Circuits with Low Power Consumption Scan Based Circuits with Low Power Consumption (en) Obvody se sériovým diagnostickým poístupem a sní3enou spotoebou (cs)
skos:prefLabel	Scan Based Circuits with Low Power Consumption Scan Based Circuits with Low Power Consumption (en) Obvody se sériovým diagnostickým poístupem a sní3enou spotoebou (cs)
skos:notation	RIV/68407700:21230/06:03120660!RIV07-GA0-21230___
http://linked.open.../vavai/riv/strany	206 ; 211
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(1QS108040510), P(GA102/04/2137)
http://linked.open...vai/riv/dodaniDat	2007
http://linked.open...aciTvurceVysledku	Novák, Ondřej
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Fakulta elektrotechnická
http://linked.open...dnocenehoVysledku	498480
http://linked.open...ai/riv/idVysledku	RIV/68407700:21230/06:03120660
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Not available (en)
http://linked.open.../riv/klicoveSlovo	Not available
http://linked.open...ontrolniKodProRIV	[3395B565F436]
http://linked.open...v/mistoKonaniAkce	Sochi
http://linked.open...i/riv/mistoVydani	Kharkov
http://linked.open...i/riv/nazevZdroje	Proceedings of the IEEE East-West Design & Test International Workshop
http://linked.open...in/vavai/riv/obor	JC
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Technology for improving the testability of modern digital circuits Design of highly reliable control systems built on dynamically reconfigurable FPGAs.
http://linked.open...UplatneniVysledku	2006
http://linked.open...iv/tvurceVysledku	Novák, Ondřej Plíva, Z.
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2006-09-15 (xsd:date)
number of pages	6 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Kharkov Institute of Physics and Technology
https://schema.org/isbn	966-659-124-3
http://localhost/t...ganizacniJednotka	21230
is http://linked.open...avai/riv/vysledek of	Scan Based Circuits with Low Power Consumption Scan Based Circuits with Low Power Consumption

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