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Description
| - A hybrid high-power impulse magnetron sputtering (HiPIMS) + mid-frequency (MF) magnetron sputtering system was used for the deposition of crystalline TiO2 thin films at a low substrate temperature. Ion velocity distribution functions were measured in a pulsed magnetron discharge at substrate positions depending on the type of plasma excitation and on theworking gasmixtures. Several different pulsed discharge configurations were used: (i) HiPIMS, (ii) pulsed bipolar MF with frequency 350 kHz and (iii) both HiPIMS + MF connected in parallel to themagnetron cathode. Ti targets were sputtered in three different types of atmospheres: (i) inert pure Ar, (ii) a reactive mixture of Ar + O2 and (iii) a reactive mixture of Ar + O2 + N2 with a constant gas pressure p = 1 Pa. All IVDFs were measured using a time-resolved retarding field energy analyzer (RFEA) located in the substrate position. The thin film properties are discussed with respect to the measured plasma parameters.
- A hybrid high-power impulse magnetron sputtering (HiPIMS) + mid-frequency (MF) magnetron sputtering system was used for the deposition of crystalline TiO2 thin films at a low substrate temperature. Ion velocity distribution functions were measured in a pulsed magnetron discharge at substrate positions depending on the type of plasma excitation and on theworking gasmixtures. Several different pulsed discharge configurations were used: (i) HiPIMS, (ii) pulsed bipolar MF with frequency 350 kHz and (iii) both HiPIMS + MF connected in parallel to themagnetron cathode. Ti targets were sputtered in three different types of atmospheres: (i) inert pure Ar, (ii) a reactive mixture of Ar + O2 and (iii) a reactive mixture of Ar + O2 + N2 with a constant gas pressure p = 1 Pa. All IVDFs were measured using a time-resolved retarding field energy analyzer (RFEA) located in the substrate position. The thin film properties are discussed with respect to the measured plasma parameters. (en)
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Title
| - Investigation of reactive HiPIMS + MF sputtering of TiO2 crystalline thin films
- Investigation of reactive HiPIMS + MF sputtering of TiO2 crystalline thin films (en)
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skos:prefLabel
| - Investigation of reactive HiPIMS + MF sputtering of TiO2 crystalline thin films
- Investigation of reactive HiPIMS + MF sputtering of TiO2 crystalline thin films (en)
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skos:notation
| - RIV/68378271:_____/13:00422122!RIV15-GA0-68378271
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - I, P(GAP108/12/1941), P(GAP108/12/2104), P(LD12002), P(LH12043), P(LH12045)
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68378271:_____/13:00422122
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - HiPIMS; mid-frequency; ion velocity distribution function; TiO2; rutile (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - CH - Švýcarská konfederace
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Surface and Coatings Technology
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Adámek, Petr
- Kment, Štěpán
- Olejníček, Jiří
- Gregora, Ivan
- Hubička, Zdeněk
- Kšírová, Petra
- Čada, Martin
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http://linked.open...ain/vavai/riv/wos
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issn
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number of pages
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http://bibframe.org/vocab/doi
| - 10.1016/j.surfcoat.2013.05.038
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