About: Optical study of BST films combining ellipsometry and reflectivity

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Optical properties of plasma laser-deposited Ba0.75Sr0.25TiO3 (BST) thin films have been investigated using variable angle spectroscopic ellipsometry (VASE) and near-normal spectroscopic reflectivity (NNSR) within a broad spectral range at room temperature. The samples prepared under various deposition conditions and the Si substrate coated with the structure SiO2/TiOx/Pt weremeasured. The Xray diffraction, atomic force microscopy and alpha step measurement were used for characterization of the samples. The platinum-coated Si substráte data were fitted as a semi-infinite medium using the Drude and Lorentz oscillators model. The structure model for optical characterization of the sample included not only the BST layers and substrate but also the intermix and surface roughness layers to achieve good agreement with experimental data. The substrate structure was modeled by a simple bulk with surface roughness. Optical properties of plasma laser-deposited Ba0.75Sr0.25TiO3 (BST) thin films have been investigated using variable angle spectroscopic ellipsometry (VASE) and near-normal spectroscopic reflectivity (NNSR) within a broad spectral range at room temperature. The samples prepared under various deposition conditions and the Si substrate coated with the structure SiO2/TiOx/Pt weremeasured. The Xray diffraction, atomic force microscopy and alpha step measurement were used for characterization of the samples. The platinum-coated Si substráte data were fitted as a semi-infinite medium using the Drude and Lorentz oscillators model. The structure model for optical characterization of the sample included not only the BST layers and substrate but also the intermix and surface roughness layers to achieve good agreement with experimental data. The substrate structure was modeled by a simple bulk with surface roughness. (en)
Title	Optical study of BST films combining ellipsometry and reflectivity Optical study of BST films combining ellipsometry and reflectivity (en)
skos:prefLabel	Optical study of BST films combining ellipsometry and reflectivity Optical study of BST films combining ellipsometry and reflectivity (en)
skos:notation	RIV/68378271:_____/09:00340744!RIV10-AV0-68378271
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA202/07/0591), Z(AV0Z10100520)
http://linked.open...iv/cisloPeriodika	10
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Kocourek, Tomáš Jelínek, Miroslav Chvostová, Dagmar Železný, Vladimír Pajasová, Libuše
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	331839
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/09:00340744
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	BST thin films; optical properties (en)
http://linked.open.../riv/klicoveSlovo	BST thin films optical properties
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[679EB3050FA1]
http://linked.open...i/riv/nazevZdroje	Applied Surface Science
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...vavai/riv/projekt	Correlation between the dielectric properties of ferroelectric thin films and superlattices and their microstructure
http://linked.open...UplatneniVysledku	2009
http://linked.open...v/svazekPeriodika	255
http://linked.open...iv/tvurceVysledku	Jelínek, Miroslav Kocourek, Tomáš Železný, Vladimír Daniš, S. Chvostová, Dagmar Pajasová, Libuše Valvoda, V.
http://linked.open...ain/vavai/riv/wos	000263865000039
http://linked.open...n/vavai/riv/zamer	Specific effects in condensed systems with reduced dimension and broken symmetry
issn	0169-4332
number of pages	4 (xsd:int)
is http://linked.open...avai/riv/vysledek of	Optical study of BST films combining ellipsometry and reflectivity Optical study of BST films combining ellipsometry and reflectivity Optical study of BST films combining ellipsometry and reflectivity Optical study of BST films combining ellipsometry and reflectivity

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