About: Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM

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About: Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	We have succeeded in the measurement of local conductivity of thin Si films under standard ambient conditions, overcoming the surface native oxide by more sensitive (pA range) current detection and we also observed the columnar structure of the amorphous phase both by TEM and AFM We have succeeded in the measurement of local conductivity of thin Si films under standard ambient conditions, overcoming the surface native oxide by more sensitive (pA range) current detection and we also observed the columnar structure of the amorphous phase both by TEM and AFM (en) Podařilo se nám provést měření lokální vodivosti tenkých Si vrstev za standardních atmosférických podmínek, když přítomnost povrchové vrstvy přirozeného oxidu byla překonána citlivější detekcí proudu (pA rozsah) a také jsme mozorovali sloupcovou strukturu amorfní fáze jak pomocí TEM, tak AFM (cs)
Title	Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM Detailní studium struktury nízkoteplotních Si vrstev se smíšenou strukturou pomocí X-TEM a atmosférického vodivostního AFM (cs) Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM (en)
skos:prefLabel	Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM Detailní studium struktury nízkoteplotních Si vrstev se smíšenou strukturou pomocí X-TEM a atmosférického vodivostního AFM (cs) Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM (en)
skos:notation	RIV/68378271:_____/06:00040682!RIV07-AV0-68378271
http://linked.open.../vavai/riv/strany	1011;1015
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GD202/05/H003), P(IAA1010316), P(IAA1010413), P(SN/3/172/05), Z(AV0Z10100521)
http://linked.open...iv/cisloPeriodika	-
http://linked.open...vai/riv/dodaniDat	2007
http://linked.open...aciTvurceVysledku	Fejfar, Antonín Mates, Tomáš Rezek, Bohuslav Kočka, Jan
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	470996
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/06:00040682
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	silicon; solar cells; plasma deposition; atomic force and scanning tunneling microscopy; TEM/STEM (en)
http://linked.open.../riv/klicoveSlovo	TEM/STEM silicon solar cells atomic force and scanning tunneling microscopy plasma deposition
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[6234FBB2A03F]
http://linked.open...i/riv/nazevZdroje	Journal of Non-Crystalline Solids
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...vavai/riv/projekt	Nanoscience and nanotechnology with scanning probe microscopes: from atomic processes to material properties Physics of complex condensed systems *Low-energy structure photovoltaic cells and PV systems elements Microcrystalline and nanocrystalline semiconductors for photonics:Electronic processes on the scales of nanometers and femtoseconds
http://linked.open...UplatneniVysledku	2006
http://linked.open...v/svazekPeriodika	352
http://linked.open...iv/tvurceVysledku	Rezek, Bohuslav Fejfar, Antonín Kočka, Jan Rath, J. K. Schropp, R. E. I. Mates, Tomáš Bronsveld, P. C. P.
http://linked.open...n/vavai/riv/zamer	Physics and technology of nanostructures, surfaces and thin films
issn	0022-3093
number of pages	5 (xsd:int)
is http://linked.open...avai/riv/vysledek of	Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM

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