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  • Some metal material can exhibit special physical phenomenon which is called plasmon resonance. This effect can be used in optical applications where designed structures, using this effect, have special function as optical filters, polarizers, holograms etc. This papers deals with preparation of plasmonic structures in poly(methyl methacrylate) (PMMA) resist which is the most common material used for e-beam processing. Designed structures were prepared by e-beam writer with Gaussian beam and accelerating voltage of 100 kV. These structures are usually prepared into negative tone resist hydrogen silsesquioxane (HSQ). We prepared these structures by unusual way into positive resist PMMA due to unavailability and cost of HSQ resist. By this way we are able to achieve high resolution of structures suitable for special optical application. Exposed structures were developed in isopropyl based developer. Final structures after development were coated by two metal layers (first one is Ag layer, second one is gold) by magnetron sputtering and vacuum evaporation. The quality of prepared plasmonic structures was examined by confocal laser scanning microscopy (CLSM) and scanning electron microscopy (SEM).
  • Some metal material can exhibit special physical phenomenon which is called plasmon resonance. This effect can be used in optical applications where designed structures, using this effect, have special function as optical filters, polarizers, holograms etc. This papers deals with preparation of plasmonic structures in poly(methyl methacrylate) (PMMA) resist which is the most common material used for e-beam processing. Designed structures were prepared by e-beam writer with Gaussian beam and accelerating voltage of 100 kV. These structures are usually prepared into negative tone resist hydrogen silsesquioxane (HSQ). We prepared these structures by unusual way into positive resist PMMA due to unavailability and cost of HSQ resist. By this way we are able to achieve high resolution of structures suitable for special optical application. Exposed structures were developed in isopropyl based developer. Final structures after development were coated by two metal layers (first one is Ag layer, second one is gold) by magnetron sputtering and vacuum evaporation. The quality of prepared plasmonic structures was examined by confocal laser scanning microscopy (CLSM) and scanning electron microscopy (SEM). (en)
Title
  • Plasmonic Structures In PMMA Resist
  • Plasmonic Structures In PMMA Resist (en)
skos:prefLabel
  • Plasmonic Structures In PMMA Resist
  • Plasmonic Structures In PMMA Resist (en)
skos:notation
  • RIV/68081731:_____/14:00437827!RIV15-TA0-68081731
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • I, P(ED0017/01/01), P(LO1212), P(TE01020233)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 36811
http://linked.open...ai/riv/idVysledku
  • RIV/68081731:_____/14:00437827
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • electron beam lithography; plasmonic structures; PMMA; metal coating (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [59706D3C8183]
http://linked.open...v/mistoKonaniAkce
  • Brno
http://linked.open...i/riv/mistoVydani
  • Ostrava
http://linked.open...i/riv/nazevZdroje
  • NANOCON 2014. 6th International conference proceedings
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Horáček, Miroslav
  • Matějka, Milan
  • Urbánek, Michal
  • Kolařík, Vladimír
  • Krátký, Stanislav
  • Šimík, M.
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • TANGER
https://schema.org/isbn
  • 978-80-87294-55-0
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