About: Advanced Microscopy and Spectroscopy Platform for Research and Development in Nano and Microtechnologies

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About: Advanced Microscopy and Spectroscopy Platform for Research and Development in Nano and Microtechnologies - AMISPEC Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Projekt, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	http://linked.opendata.cz/ontology/domain/vavai/Projekt
rdfs:seeAlso	http://www.isvav.cz/projectDetail.do?rowId=TE01020233
Description	The project forms a RaD platform bringing together 3 companies and 2 research intsitutions in CR which will be aimed at 1) building complex scientific instruments and 2) finding methods and procedures for its application in fabrication and characterization of functional nanostructures and semiconductor materials/devices. The 2nd activity will result in technologies and analyses for high-tech applications both for professional and public community ((bio)sensors, security elements,etc.). (en) Projekt vytváří VaV platformu sdružující 3 high-tech firmy a 2 přední výzkumná pracoviště v ČR, která se zaměří na 1) budování komplexní přístrojové základny a 2) hledání metod a postupů pro její aplikaci při tvorbě a charakterizaci funkčních nanostruktur a polovodičových materiálů/součástek. Druhá aktivita povede ke vzniku portfolia technologií a diagnostických postupů pro tvorbu nových high-tech aplikací pro odbornou komunitu i veřejnost ((bio)sensorů, optických bezpečnostních prvků aj.).
Title	Advanced Microscopy and Spectroscopy Platform for Research and Development in Nano and Microtechnologies - AMISPEC (en) Platforma pokročilých mikroskopických a spektroskopických technik pro nano a mikrotechnologie
skos:notation	TE01020233
http://linked.open...avai/cep/aktivita	Competence Centres
http://linked.open...kovaStatniPodpora	http://linked.opendata.cz/resource/domain/vavai/projekt/TE01020233/celkovaStatniPodpora
http://linked.open...ep/celkoveNaklady	http://linked.opendata.cz/resource/domain/vavai/projekt/TE01020233/celkoveNaklady
http://linked.open...datumDodatniDoRIV	2015-05-26 (xsd:date)
http://linked.open...i/cep/druhSouteze	VS - Veřejná soutěž ve výzkumu a vývoji
http://linked.open...ep/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open.../cep/fazeProjektu	100995641
http://linked.open...ai/cep/hlavniObor	BA - Obecná matematika
http://linked.open...vai/cep/kategorie	AP - Aplikovaný výzkum
http://linked.open.../cep/klicovaSlova	Electron beam lithography, Scanning electron microscopy, Scanning probe microscopy, Ultra high vacuum, Nanofabrication, Functional properties of nanostructures (en)
http://linked.open...ep/partnetrHlavni	Fakulta strojního inženýrství
http://linked.open...inujicichPrijemcu	0 (xsd:int)
http://linked.open...cep/pocetPrijemcu	1 (xsd:int)
http://linked.open...ocetSpoluPrijemcu	4 (xsd:int)
http://linked.open.../pocetVysledkuRIV	71 (xsd:int)
http://linked.open...enychVysledkuVRIV	71 (xsd:int)
http://linked.open...lneniVMinulemRoce	2014-03-03 (xsd:date)
http://linked.open.../prideleniPodpory	http://linked.opendata.cz/resource/domain/vavai/cep/prideleniPodpory/2012TE01020233
http://linked.open...iciPoslednihoRoku	2015
http://linked.open...atUdajeProjZameru	2015
http://linked.open.../vavai/cep/soutez	STA02012CK
http://linked.open...usZobrazovaneFaze	DRRVB
http://linked.open...ai/cep/typPojektu	P - Projekt výzkumu a vývoje financovaný ze státního rozpočtu
http://linked.open...ep/ukonceniReseni	2019-12-31 (xsd:date)
http://linked.open.../cep/vedlejsiObor	BM - Fyzika pevných látek a magnetismus JA - Elektronika a optoelektronika, elektrotechnika
http://linked.open...ep/zahajeniReseni	2012-03-01 (xsd:date)
http://linked.open...tniCyklusProjektu	ZBBB
http://linked.open.../cep/klicoveSlovo	Nanofabrication Scanning electron microscopy Scanning probe microscopy Ultra high vacuum Electron beam lithography
is http://linked.open...vavai/riv/projekt of	Displacement measurement with intracavity interferometry E-beam Nano-patterning for Electroforming Replication Piezo-impact drive Plasmonic Structures In PMMA Resist Nanometrology interferometric coordinates measurement system for local probe microscopy Laser standards for interferometry and stable frequencies distribution Manipulation of metal-dielectric core-shell particles in optical fields Control and Near-Field Detection of Surface Plasmon Interference Patterns Interference povrchových plazmonů v blízkém poli Interferometric coordinates measurement sytem for local probe microscopy nanometrology Interferometry with suppression of fast fluctuations of the refractive index of air for nanometrology Interferometric system with tracking refractometry capability in the measuring axis Low conductive support for thermal insulation of a sample holder of a variable temperature scanning tunneling microscope Nanopositioning with detection of a standing wave Multidimensionální interferometrický odměřovací systém pro AFM mikroskopii - národní etalon pro nanometrologii Single laser beam based passive optical sorter Calibration specimens for microscopy Application of scanning near field optical microscope for plasmonics System for charakterization and optimization of piezoactuators Device for analysis of silicon wafers Monte-Carlo simulation of proximity effect in e-beam lithography Interferometry with Stabilization of Wavelength within a Fixed Measuring Range Interferometry in a passive Fabry-Perot cavity with the detection of a standing wave Interferometrický systém pro souřadnicové odměřování Interferometrický odměřovací systém pro elektronový litograf Radiatively heated Al effesion cell Three segment ogranic molecule evaporation source 6-axis interferometric coordinates measurement system for nanometrology Detection standing wave within Fabry-Perot Cavity Experimental demonstration of optical transport, sorting and self arrangement using a tractor beam Laserový systém pro odměřování 3D polohy s nanometrovým rozlišením pro mikroskopy Shaped E-beam nanopatterning with proximity effect correction Spectral Properties of Saturation Pressure Filled Iodine Absorption Cells Displacement Interferometry within a Passive Fabry-Perot Cavity Lift-Off technique using different e-beam writers Sublimation source of carbon atoms Studium chování proudění vzduchu přes délkový šum při interferometrickém měření Displacement interferometry with stabilization of wavelength in air Differential interferometry with suppression of the influence of refractive index of air for nanometrology Displacement measurement with over-determined interferometer Characterization methods of graphene Optimization of ion-atomic beam source for deposition of GaN ultrathin films Precision displacement interferometry with stabilization of wavelength on air Response of plasmonic resonant nanorods: an analytical approach to optical antennas Refractive Index Compensation in Over-Determined Interferometric Systems Variable-shape E-beam litography: Proximity effect simulation of 3D micro and nano sructures Precision positioning with suppression of the influence of refractive index of air Advanced Laser Measuring Systems in Nanometrology Practical E-Beam Lithography Předzesilovač signálu z křemenné ladící vidličky High-power laser diode array linewidth reduced by the external injection locking technique LIDT testy optických komponentů při kryogenních teplotách Vysokonapěťový zesilovač a lineární nízkošumový zdroj Phase photo masks produced by means of electron beam lithography and ion etching for Bragg gratings Ambient conditions SPM Tip etching station Comparison of ultimate resolution achieved by e-beam writers with shaped beam and with Gaussian beam Fabrication of ordered arrays of gold islands Preparation of micro and nanostructures by selective Si wet etching Comparison of Molecular Iodine Spectral Properties at 514.7 and 532 nm Wavelengths

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