About: Displacement measurement with intracavity interferometry

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	We present a measuring technique for displacement and position sensing over a limited range with detection of standingwave pattern inside of a passive Fabry-Perot cavity. The concept considers locking of the laser optical frequency and the length of the Fabry-Perot cavity in resonance. Fixing the length of the cavity to e.g. a highly stable mechanical reference allows to stabilize wavelength of the laser in air and thus to eliminate especially the faster fluctuations of refractive index of air due to air flow and inhomogeneities. Sensing of the interference maxima and minima within the cavity along the beam axis has been tested and proven with a low loss photoresistive photodetector based on a thin polycrystalline silicon layer. Reduction of losses was achieved thanks to a design as an optimized set of interference layers acting as an antireflection coating. The principle is demonstrated on an experimental setup. We present a measuring technique for displacement and position sensing over a limited range with detection of standingwave pattern inside of a passive Fabry-Perot cavity. The concept considers locking of the laser optical frequency and the length of the Fabry-Perot cavity in resonance. Fixing the length of the cavity to e.g. a highly stable mechanical reference allows to stabilize wavelength of the laser in air and thus to eliminate especially the faster fluctuations of refractive index of air due to air flow and inhomogeneities. Sensing of the interference maxima and minima within the cavity along the beam axis has been tested and proven with a low loss photoresistive photodetector based on a thin polycrystalline silicon layer. Reduction of losses was achieved thanks to a design as an optimized set of interference layers acting as an antireflection coating. The principle is demonstrated on an experimental setup. (en)
Title	Displacement measurement with intracavity interferometry Displacement measurement with intracavity interferometry (en)
skos:prefLabel	Displacement measurement with intracavity interferometry Displacement measurement with intracavity interferometry (en)
skos:notation	RIV/68081731:_____/14:00434164!RIV15-TA0-68081731
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(ED0017/01/01), P(EE2.4.31.0016), P(GPP102/11/P820), P(LO1212), P(TA01010995), P(TA02010711), P(TE01020233)
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Číp, Ondřej Lazar, Josef Oulehla, Jindřich Holá, Miroslava
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	11768
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/14:00434164
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	antireflective coatings; Fabry–Perot interferometers; interferometry; lasers; photodetectors; refractive index; silicon (en)
http://linked.open.../riv/klicoveSlovo	antireflective coatings silicon Fabry–Perot interferometers photodetectors interferometry lasers refractive index
http://linked.open...ontrolniKodProRIV	[C0CE8F911FFB]
http://linked.open...v/mistoKonaniAkce	Brussels
http://linked.open...i/riv/mistoVydani	Bellingham
http://linked.open...i/riv/nazevZdroje	Optical Micro- and Nanometrology V. (Proceedings of SPIE 9132)
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...vavai/riv/projekt	Advanced Microscopy and Spectroscopy Platform for Research and Development in Nano and Microtechnologies - AMISPEC ALISI - Centre of advanced diagnostic methods and technologies APPLICATION LABORATORIES OF ADVANCED MICROTECHNOLOGIES AND NANOTECHNOLOGIES Stabilized laser sources fro spectrometer calibration of optical communications. Interferometric measurement techniques for nanopositioning Advanced interferometric systems for measurement in nanotechnology MEDTECH - educational and research partner network in medicine, biomedicine and scientific instruments
http://linked.open...UplatneniVysledku	2014
http://linked.open...iv/tvurceVysledku	Lazar, Josef Číp, Ondřej Fejfar, Antonín Oulehla, Jindřich Stuchlík, Jiří Kočka, Jan Holá, Miroslava
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open...ain/vavai/riv/wos	000345034500032
http://linked.open.../riv/zahajeniAkce	2014-04-15 (xsd:date)
issn	0277-786X
number of pages	6 (xsd:int)
http://bibframe.org/vocab/doi	10.1117/12.2052923
http://purl.org/ne...btex#hasPublisher	SPIE

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