About: Low conductive support for thermal insulation of a sample holder of a variable temperature scanning tunneling microscope     Goto   Sponge   NotDistinct   Permalink

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  • We have designed a supporting system to fix a sample holder of a scanning tunneling microscope in an UHV chamber at room temperature. The microscope will operate down to a temperature of 20 K. Low thermal conductance, high mechanical stiffness, and small dimensions are the main features of the supporting system. Three sets of four glass balls placed in vertices of a tetrahedron are used for thermal insulation based on small contact areas between the glass balls. We have analyzed the thermal conductivity of the contacts between the balls mutually and between a ball and a metallic plate while the results have been applied to the entire support. The calculation based on a simple model of the setup has been verified with some experimental measurements. In comparison with other feasible supporting structures, the designed support has the lowest thermal conductance.
  • We have designed a supporting system to fix a sample holder of a scanning tunneling microscope in an UHV chamber at room temperature. The microscope will operate down to a temperature of 20 K. Low thermal conductance, high mechanical stiffness, and small dimensions are the main features of the supporting system. Three sets of four glass balls placed in vertices of a tetrahedron are used for thermal insulation based on small contact areas between the glass balls. We have analyzed the thermal conductivity of the contacts between the balls mutually and between a ball and a metallic plate while the results have been applied to the entire support. The calculation based on a simple model of the setup has been verified with some experimental measurements. In comparison with other feasible supporting structures, the designed support has the lowest thermal conductance. (en)
Title
  • Low conductive support for thermal insulation of a sample holder of a variable temperature scanning tunneling microscope
  • Low conductive support for thermal insulation of a sample holder of a variable temperature scanning tunneling microscope (en)
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  • Low conductive support for thermal insulation of a sample holder of a variable temperature scanning tunneling microscope
  • Low conductive support for thermal insulation of a sample holder of a variable temperature scanning tunneling microscope (en)
skos:notation
  • RIV/68081731:_____/13:00395139!RIV14-TA0-68081731
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  • I, P(ED0017/01/01), P(TE01020233)
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  • 8
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  • 85460
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  • RIV/68081731:_____/13:00395139
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  • Thermal conductiviy; Scanning tunneling microscope (en)
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  • US - Spojené státy americké
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  • [69B631FEC2CE]
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  • Review of Scientific Instruments
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  • 84
http://linked.open...iv/tvurceVysledku
  • Hanzelka, Pavel
  • Musilová, Věra
  • Vonka, J.
http://linked.open...ain/vavai/riv/wos
  • 000323947400059
issn
  • 0034-6748
number of pages
http://bibframe.org/vocab/doi
  • 10.1063/1.4817214
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