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Description
  • The contribution is oriented towards measuring in the nanoscale through local probe microscopy techniques, primarily the AFM microscopy. The need to make the AFM microscope a nanometrology tool not only the positioning of the tip has to be based on precise measurements but the traceability of the measuring technique has to be ensured up to the primary etalon. This leads to the engagement of laser interferometric measuring methods. We present a design of a single-frequency stabilized laser which serves as a laser source for multiaxis position control of a nanopositioning stage. We have decided for a frequency-doubled Nd:YAG laser with thermal frequency control locked to a Doppler-broadened absorption line in iodine. The laser stabilization technique is described together with comparison of frequency stability.
  • The contribution is oriented towards measuring in the nanoscale through local probe microscopy techniques, primarily the AFM microscopy. The need to make the AFM microscope a nanometrology tool not only the positioning of the tip has to be based on precise measurements but the traceability of the measuring technique has to be ensured up to the primary etalon. This leads to the engagement of laser interferometric measuring methods. We present a design of a single-frequency stabilized laser which serves as a laser source for multiaxis position control of a nanopositioning stage. We have decided for a frequency-doubled Nd:YAG laser with thermal frequency control locked to a Doppler-broadened absorption line in iodine. The laser stabilization technique is described together with comparison of frequency stability. (en)
Title
  • Laser Source for Interferometry in Nanometrology
  • Laser Source for Interferometry in Nanometrology (en)
skos:prefLabel
  • Laser Source for Interferometry in Nanometrology
  • Laser Source for Interferometry in Nanometrology (en)
skos:notation
  • RIV/68081731:_____/10:00352194!RIV11-GA0-68081731
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(2A-1TP1/127), P(2A-3TP1/113), P(2C06012), P(FT-TA3/133), P(GA102/07/1179), P(GA102/09/1276), P(LC06007), Z(AV0Z20650511)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 267948
http://linked.open...ai/riv/idVysledku
  • RIV/68081731:_____/10:00352194
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • nanometrology; AFM microscopy; interferometry (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [D23414F77C48]
http://linked.open...v/mistoKonaniAkce
  • Ottawa
http://linked.open...i/riv/mistoVydani
  • Ottawa
http://linked.open...i/riv/nazevZdroje
  • Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Hrabina, Jan
  • Lazar, Josef
  • Číp, Ondřej
  • Čížek, Martin
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • International ASET
https://schema.org/isbn
  • 978-0-9867183-0-4
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