About: Enhancement of SEM to scanning LEEM

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Článek charakterizuje způsoby zavedení rastrovací verze LEEM do konvenčního SEM prostřednictvím vložení katodové čočky pod objektiv přístroje. Shrnuty jsou základní vlastnosti rastrovacího LEEMu. (cs) Paper summarizes ways to incorporating the scanning LEEM method into a conventional SEM via introduction of the cathode lens to below the objective lens. Basic properties of the scanning LEEM are provided. Paper summarizes ways to incorporating the scanning LEEM method into a conventional SEM via introduction of the cathode lens to below the objective lens. Basic properties of the scanning LEEM are provided. (en)
Title	Enhancement of SEM to scanning LEEM Enhancement of SEM to scanning LEEM (en) Rozšíření SEM na rastrovací LEEM (cs)
skos:prefLabel	Enhancement of SEM to scanning LEEM Enhancement of SEM to scanning LEEM (en) Rozšíření SEM na rastrovací LEEM (cs)
skos:notation	RIV/68081731:_____/07:00088945!RIV08-GA0-68081731
http://linked.open.../vavai/riv/strany	4768;4773
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/05/2327), P(GA202/04/0281), Z(AV0Z20650511)
http://linked.open...iv/cisloPeriodika	20
http://linked.open...vai/riv/dodaniDat	2008
http://linked.open...aciTvurceVysledku	Müllerová, Ilona Hrnčiřík, Petr Frank, Luděk
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	420192
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/07:00088945
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	SEM; LEEM; scanning LEEM (en)
http://linked.open.../riv/klicoveSlovo	SEM LEEM scanning LEEM
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[C5AA18559FFB]
http://linked.open...i/riv/nazevZdroje	Surface Science
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Mapping at a high spatial resolution of the local density of electron states via reflection of very slow electrons Direct imaging of the dopant distribution in a semiconductor by means of low energy clectrons
http://linked.open...UplatneniVysledku	2007
http://linked.open...v/svazekPeriodika	601
http://linked.open...iv/tvurceVysledku	Müllerová, Ilona Frank, Luděk Matsuda, K. Hrnčiřík, Petr
http://linked.open...n/vavai/riv/zamer	Research into experimental methods for examination of the physical properties of matter and their application in advanced technologies
issn	0039-6028
number of pages	6 (xsd:int)
is http://linked.open...avai/riv/vysledek of	Enhancement of SEM to scanning LEEM Enhancement of SEM to scanning LEEM Enhancement of SEM to scanning LEEM

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