About: A Reliability Lab-on-chip Using Programmable Arrays

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
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rdfs:seeAlso	http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=6&SID=R2Ihc8Vb4DCzHkD6jzl&page=1&doc=2
Description	This paper presents a new concept of a reliability labon-chip-an ultimate platform for complete in-situ measurement, processing and evaluation of a chip reliability parameters, including aging purposes. It is shown how multiple test structures, including the measurement blocks, can be ad-hoc created and evaluated directly on a Field-Programmable Gate Array (FPGA) chip. Results from measurements including 45 nm and 28 nm processes are presented as well. This paper presents a new concept of a reliability labon-chip-an ultimate platform for complete in-situ measurement, processing and evaluation of a chip reliability parameters, including aging purposes. It is shown how multiple test structures, including the measurement blocks, can be ad-hoc created and evaluated directly on a Field-Programmable Gate Array (FPGA) chip. Results from measurements including 45 nm and 28 nm processes are presented as well. (en)
Title	A Reliability Lab-on-chip Using Programmable Arrays A Reliability Lab-on-chip Using Programmable Arrays (en)
skos:prefLabel	A Reliability Lab-on-chip Using Programmable Arrays A Reliability Lab-on-chip Using Programmable Arrays (en)
skos:notation	RIV/46747885:24220/14:#0003130!RIV15-MSM-24220___
http://linked.open...avai/riv/aktivita	P S
http://linked.open...avai/riv/aktivity	P(LD13019), S
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Plíva, Zdeněk Pfeifer, Petr
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Technická univerzita v Liberci / Fakulta mechatroniky, informatiky a mezioborových studií
http://linked.open...dnocenehoVysledku	1102
http://linked.open...ai/riv/idVysledku	RIV/46747885:24220/14:#0003130
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	aging (en)
http://linked.open.../riv/klicoveSlovo	aging
http://linked.open...ontrolniKodProRIV	[A462C14DC205]
http://linked.open...v/mistoKonaniAkce	Waikoloa, HI; United States
http://linked.open...i/riv/nazevZdroje	52nd IEEE International Reliability Physics Symposium, IRPS 2014
http://linked.open...in/vavai/riv/obor	JC
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Improvement in Reliability of Nano-scale circuits
http://linked.open...UplatneniVysledku	2014
http://linked.open...iv/tvurceVysledku	Plíva, Zdeněk Pfeifer, Petr
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open...ain/vavai/riv/wos	000343833200125
http://linked.open.../riv/zahajeniAkce	2014-01-01 (xsd:date)
issn	1541-7026
number of pages	8 (xsd:int)
http://bibframe.org/vocab/doi	10.1109/IRPS.2014.6861123
http://purl.org/ne...btex#hasPublisher	IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
https://schema.org/isbn	978-1-4799-3317-4
http://localhost/t...ganizacniJednotka	24220

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