About: On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions.

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions. Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6645584&isnumber=6645482
Description	This paper presents a method and results from measurement of internal parameters of Xilinx XC7Z020 Zynq device - the programmable microelectronic nanostructures designed on 28 nm TSMC's technology. The presented method utilizes undersampling approach and a very easy way of processing of BRAM data streams. The presented flexible circuits have been used in various measurements of timing parameters delays in FPGAs, up to measurements or detection of the aging issues. The paper presents surprising overview of such measurements with the key result, that the usability of the latest 28 nm devices under accelerated conditions is strictly limited to lower frequencies or significantly lower temperatures. It also significantly limits the possibility of study of aging effects under accelerated conditions and might affect security applications. The paper extends the measurements and results available from previous technology nodes and tries to uncover new information and areas of the latest high-end technologies. This paper presents a method and results from measurement of internal parameters of Xilinx XC7Z020 Zynq device - the programmable microelectronic nanostructures designed on 28 nm TSMC's technology. The presented method utilizes undersampling approach and a very easy way of processing of BRAM data streams. The presented flexible circuits have been used in various measurements of timing parameters delays in FPGAs, up to measurements or detection of the aging issues. The paper presents surprising overview of such measurements with the key result, that the usability of the latest 28 nm devices under accelerated conditions is strictly limited to lower frequencies or significantly lower temperatures. It also significantly limits the possibility of study of aging effects under accelerated conditions and might affect security applications. The paper extends the measurements and results available from previous technology nodes and tries to uncover new information and areas of the latest high-end technologies. (en)
Title	On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions. On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions. (en)
skos:prefLabel	On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions. On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions. (en)
skos:notation	RIV/46747885:24220/13:#0002859!RIV14-MSM-24220___
http://linked.open...avai/predkladatel	Fakulta mechatroniky, informatiky a mezioborových studií
http://linked.open...avai/riv/aktivita	P S
http://linked.open...avai/riv/aktivity	P(LD13019), S
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Plíva, Zdeněk Pfeifer, Petr
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Technická univerzita v Liberci / Fakulta mechatroniky, informatiky a mezioborových studií
http://linked.open...dnocenehoVysledku	93745
http://linked.open...ai/riv/idVysledku	RIV/46747885:24220/13:#0002859
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	aging (en)
http://linked.open.../riv/klicoveSlovo	aging
http://linked.open...ontrolniKodProRIV	[05C45D31A5A3]
http://linked.open...v/mistoKonaniAkce	Porto, Portugal
http://linked.open...i/riv/mistoVydani	Porto, Portugal
http://linked.open...i/riv/nazevZdroje	In:23rd International Conference on Field Programmable Logic and Applications (FPL'13)
http://linked.open...in/vavai/riv/obor	JC
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Improvement in Reliability of Nano-scale circuits
http://linked.open...UplatneniVysledku	2013
http://linked.open...iv/tvurceVysledku	Plíva, Zdeněk Pfeifer, Petr
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2013-01-01 (xsd:date)
number of pages	4 (xsd:int)
http://bibframe.org/vocab/doi	10.1109/FPL.2013.6645584
http://purl.org/ne...btex#hasPublisher	IEEE
https://schema.org/isbn	978-1-4799-0004-6
http://localhost/t...ganizacniJednotka	24220

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 58 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software