About: COMPAS III - compressed test pattern sequencer     Goto   Sponge   NotDistinct   Permalink

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Description
  • The COMPAS III tool implements new compression algorithm, that generates the test sequence for a given circuit by compressing a test data created by an external ATPG. The resulting compressed test sequence can be transmitted through a narrow Test Access Mechanism into the tested IC and there it can be easily decompressed. The compression is based on test pattern overlapping, bit prediction, iterative fault simulation and hard to test fault preference. The effectivity of compression is greater than for other commercial compression tools.
  • The COMPAS III tool implements new compression algorithm, that generates the test sequence for a given circuit by compressing a test data created by an external ATPG. The resulting compressed test sequence can be transmitted through a narrow Test Access Mechanism into the tested IC and there it can be easily decompressed. The compression is based on test pattern overlapping, bit prediction, iterative fault simulation and hard to test fault preference. The effectivity of compression is greater than for other commercial compression tools. (en)
Title
  • COMPAS III - compressed test pattern sequencer
  • COMPAS III - compressed test pattern sequencer (en)
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  • COMPAS III - compressed test pattern sequencer
  • COMPAS III - compressed test pattern sequencer (en)
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  • RIV/46747885:24220/09:#0001392!RIV10-GA0-24220___
http://linked.open...avai/riv/aktivita
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  • P(GA102/09/1668)
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  • 307832
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  • RIV/46747885:24220/09:#0001392
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  • COMPAS III
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  • test compression (en)
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  • [BBBD5B3A7523]
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  • CLI program v jazyce C pro platformy Linux, Windows a SunOS.
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  • Jeníček, Jiří
  • Novák, Ondřej
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  • 24220
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