About: Noise in Thick-Film Pressure Sensors

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Industrial demand for high reliability of electronic devices stimulates research in the field of transport and noise phenomena in pressure sensors based on the thick conducting films. We are concentrating our effort on the use of low frequency noise as a diagnostic tool for the reliability improvement and sensitivity increase of the thick film pressure sensors. The recent development of some new technologies increases the interest for ceramic pressure sensors (CPS). One of these technologies is low-temperature co-fired ceramic (LTCC) technology. This technology and material in combination with conventional thick-film technology offers a feasible solution to increase the sensitivity of the pressure sensors and the flexibility in design, both with the intention to replace the silicon-based pressure sensor in some applications. Low frequency noise is a sensitive indicator of the presence of defects and imperfection in the structure. The measurements of the electronic noise level could be used for the eva Industrial demand for high reliability of electronic devices stimulates research in the field of transport and noise phenomena in pressure sensors based on the thick conducting films. We are concentrating our effort on the use of low frequency noise as a diagnostic tool for the reliability improvement and sensitivity increase of the thick film pressure sensors. The recent development of some new technologies increases the interest for ceramic pressure sensors (CPS). One of these technologies is low-temperature co-fired ceramic (LTCC) technology. This technology and material in combination with conventional thick-film technology offers a feasible solution to increase the sensitivity of the pressure sensors and the flexibility in design, both with the intention to replace the silicon-based pressure sensor in some applications. Low frequency noise is a sensitive indicator of the presence of defects and imperfection in the structure. The measurements of the electronic noise level could be used for the eva (en)
Title	Noise in Thick-Film Pressure Sensors Noise in Thick-Film Pressure Sensors (en)
skos:prefLabel	Noise in Thick-Film Pressure Sensors Noise in Thick-Film Pressure Sensors (en)
skos:notation	RIV/00216305:26220/11:PU95272!RIV12-MSM-26220___
http://linked.open...avai/predkladatel	Fakulta elektrotechniky a komunikačních technologií
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/09/1920), P(GD102/09/H074), P(MEB091129), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2012
http://linked.open...aciTvurceVysledku	Majzner, Jiří Sedláková, Vlasta Kopecký, Martin
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	216141
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/11:PU95272
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	1/f noise, Thick Film, Pressure Sensors (en)
http://linked.open.../riv/klicoveSlovo	1/f noise Pressure Sensors Thick Film
http://linked.open...ontrolniKodProRIV	[FDDEE758B803]
http://linked.open...v/mistoKonaniAkce	Ajdovščina, Slovenia
http://linked.open...i/riv/mistoVydani	Ajdovščina, Slovenia
http://linked.open...i/riv/nazevZdroje	CARTS EUROPE 2011 PROCEEDING
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	8 (xsd:int)
http://linked.open...vavai/riv/projekt	Stochastic Phenomena in MIS and MIM Semiconductor Structures Diagnostics of material defects using the latest defectoscopic methods Investigation of the noise of thick-film pressure sensors
http://linked.open...UplatneniVysledku	2011
http://linked.open...iv/tvurceVysledku	Kopecký, Martin Majzner, Jiří Sedlák, Petr Sedláková, Vlasta Šikula, Josef Belavic, Darko Hrovat, Marko Santo-Zarnik, Marina
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2011-11-28 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	MIDEM
https://schema.org/isbn	0-7908-0155-8
http://localhost/t...ganizacniJednotka	26220
is http://linked.open...avai/riv/vysledek of	Noise in Thick-Film Pressure Sensors Noise in Thick-Film Pressure Sensors

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