About: LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The Mean Time to Failure (MTTF) method is usually applied as the standard conventional reliability test for Multilayer Ceramic Capacitors (MLCC). We propose a reliability test based on the leakage current and the low frequency noise spectral density evaluation. Both the leakage current and 1/f noise amplitudes give time saving reliability information much faster than those of the conventional MTTF method. We have measured the DC leakage currents of MLCCs and found from the VA characteristics evaluation that the Poole-Frenkel (PF) transport mechanism is dominant in the samples for the low electric field - applied voltage results indicate the typical Poole-Frenkel electron transport in the insulating BaTiO3 layers, giving the PF constants and the barrier heights. The low frequency noise characteristics are observed at a proper combination of the measuring circuits, and the normalized noise amplitudes are obtained as the function of the MLCC series resistance. The 1/f noise amplitudes are found more than The Mean Time to Failure (MTTF) method is usually applied as the standard conventional reliability test for Multilayer Ceramic Capacitors (MLCC). We propose a reliability test based on the leakage current and the low frequency noise spectral density evaluation. Both the leakage current and 1/f noise amplitudes give time saving reliability information much faster than those of the conventional MTTF method. We have measured the DC leakage currents of MLCCs and found from the VA characteristics evaluation that the Poole-Frenkel (PF) transport mechanism is dominant in the samples for the low electric field - applied voltage results indicate the typical Poole-Frenkel electron transport in the insulating BaTiO3 layers, giving the PF constants and the barrier heights. The low frequency noise characteristics are observed at a proper combination of the measuring circuits, and the normalized noise amplitudes are obtained as the function of the MLCC series resistance. The 1/f noise amplitudes are found more than (en)
Title	LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs (en)
skos:prefLabel	LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs (en)
skos:notation	RIV/00216305:26220/10:PU89315!RIV11-GA0-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/09/1920), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Sedláková, Vlasta Šikula, Josef Kopecký, Martin
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	268070
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/10:PU89315
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	LEAKAGE CURRENT, NOISE, RELIABILITY , HIGH VOLTAGE ,MLCCs (en)
http://linked.open.../riv/klicoveSlovo	NOISE HIGH VOLTAGE LEAKAGE CURRENT MLCCs RELIABILITY
http://linked.open...ontrolniKodProRIV	[9B626850725F]
http://linked.open...v/mistoKonaniAkce	New Orleans
http://linked.open...i/riv/mistoVydani	USA,New Orleans
http://linked.open...i/riv/nazevZdroje	CARTS USA 2010 PROCEEDINGS
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...vavai/riv/projekt	Stochastic Phenomena in MIS and MIM Semiconductor Structures
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Kopecký, Martin Sedláková, Vlasta Tacano, Munecazu Šikula, Josef Tanuma, Nobuhisa Morohoshi, Y. Ohya, H.
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2010-03-15 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	7 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Electronic Components Association
https://schema.org/isbn	0-7908-0150-7
http://localhost/t...ganizacniJednotka	26220
is http://linked.open...avai/riv/vysledek of	LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 77 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software