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  • In this paper the theoretical analysis of the correctness of applying the effective medium approximation (EMA) at the ellipsometric studies of rough surfaces is presented. Within this analysis the Rayleigh-Rice theory (RRT) is used to calculate the simulated ellipsometric data of various slightly randomly rough surfaces. This simulated data are treated using the least-squares method for finding the values of the parameters characterizing the rough surfaces within the EMA, i.e. the values of thickness and packing density factor describing a fictitious (effective) thin films replacing these surfaces within the EMA. It is shown that the EMA could be used to interprete the ellipsometric data of the rough surfaces in a correct way if their roughness only contains the high spatial frequencies. For the low spatial frequencies it is shown that the influence of the surface roughness on the ellipsometric quantities is small in contrast to its influence on the reflectance.
  • In this paper the theoretical analysis of the correctness of applying the effective medium approximation (EMA) at the ellipsometric studies of rough surfaces is presented. Within this analysis the Rayleigh-Rice theory (RRT) is used to calculate the simulated ellipsometric data of various slightly randomly rough surfaces. This simulated data are treated using the least-squares method for finding the values of the parameters characterizing the rough surfaces within the EMA, i.e. the values of thickness and packing density factor describing a fictitious (effective) thin films replacing these surfaces within the EMA. It is shown that the EMA could be used to interprete the ellipsometric data of the rough surfaces in a correct way if their roughness only contains the high spatial frequencies. For the low spatial frequencies it is shown that the influence of the surface roughness on the ellipsometric quantities is small in contrast to its influence on the reflectance. (en)
Title
  • Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces
  • Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces (en)
skos:prefLabel
  • Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces
  • Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces (en)
skos:notation
  • RIV/00216224:14310/05:00013547!RIV10-MSM-14310___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(FT-TA/094), Z(MSM 143100003)
http://linked.open...iv/cisloPeriodika
  • 1
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 515863
http://linked.open...ai/riv/idVysledku
  • RIV/00216224:14310/05:00013547
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Roughness; Ellipsometry; EMA; RRT (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [054FD68654B0]
http://linked.open...i/riv/nazevZdroje
  • Optics Communications
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 248
http://linked.open...iv/tvurceVysledku
  • Franta, Daniel
  • Ohlídal, Ivan
http://linked.open...n/vavai/riv/zamer
issn
  • 0030-4018
number of pages
http://localhost/t...ganizacniJednotka
  • 14310
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