About: Optical Characterization of Chalcogenide Thin Films

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In this paper the optical characterization of a film of amorphous As-S chalcogenides evaporated on glass substrates will be performed using variable angle of incidence spectroscopic ellipsometry (VASE) and near normal incidence spectroscopic reflectometry (NNSR). The spectral dependences of the ellipsometric parameters and reflectance of the chalcogenide thin film mentioned is measured within the near-UV, visible and near-IR spectral regions. For interpreting these optical quantities the new dispersion model of the spectral dependences of the optical constants of amorphous solids is employed. This model is based on the modified Lorentz oscillator. Within this model the concepts of the band gap and Urbach tail are respected. In this paper the optical characterization of a film of amorphous As-S chalcogenides evaporated on glass substrates will be performed using variable angle of incidence spectroscopic ellipsometry (VASE) and near normal incidence spectroscopic reflectometry (NNSR). The spectral dependences of the ellipsometric parameters and reflectance of the chalcogenide thin film mentioned is measured within the near-UV, visible and near-IR spectral regions. For interpreting these optical quantities the new dispersion model of the spectral dependences of the optical constants of amorphous solids is employed. This model is based on the modified Lorentz oscillator. Within this model the concepts of the band gap and Urbach tail are respected. (en) In this paper the optical characterization of a film of amorphous As-S chalcogenides evaporated on glass substrates will be performed using variable angle of incidence spectroscopic ellipsometry (VASE) and near normal incidence spectroscopic reflectometry (NNSR). The spectral dependences of the ellipsometric parameters and reflectance of the chalcogenide thin film mentioned is measured within the near-UV, visible and near-IR spectral regions. For interpreting these optical quantities the new dispersion model of the spectral dependences of the optical constants of amorphous solids is employed. This model is based on the modified Lorentz oscillator. Within this model the concepts of the band gap and Urbach tail are respected. (cs)
Title	Optical Characterization of Chalcogenide Thin Films Optical Characterization of Chalcogenide Thin Films (en) Optical Characterization of Chalcogenide Thin Films (cs)
skos:prefLabel	Optical Characterization of Chalcogenide Thin Films Optical Characterization of Chalcogenide Thin Films (en) Optical Characterization of Chalcogenide Thin Films (cs)
skos:notation	RIV/00216224:14310/01:00004310!RIV08-GA0-14310___
http://linked.open.../vavai/riv/strany	555
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GA203/00/0085), P(LN00A028)
http://linked.open...iv/cisloPeriodika	1
http://linked.open...vai/riv/dodaniDat	2008
http://linked.open...aciTvurceVysledku	Ohlídal, Ivan Franta, Daniel
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Masarykova univerzita / Přírodovědecká fakulta
http://linked.open...dnocenehoVysledku	690173
http://linked.open...ai/riv/idVysledku	RIV/00216224:14310/01:00004310
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Chalcogenide films; Dispersion model; Ellipsometry; Reflectometry (en)
http://linked.open.../riv/klicoveSlovo	Dispersion model Ellipsometry Chalcogenide films Reflectometry
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[ADB122290018]
http://linked.open...i/riv/nazevZdroje	Applied Surface Science
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	New inorganic compounds and advanced materials Optical properties of glasses and amorphous thin films of sulphides and selenides
http://linked.open...UplatneniVysledku	2001
http://linked.open...v/svazekPeriodika	175-176
http://linked.open...iv/tvurceVysledku	Franta, Daniel Frumar, Miloslav Ohlídal, Ivan Jedelský, Jaroslav
issn	0169-4332
number of pages	7 (xsd:int)
http://localhost/t...ganizacniJednotka	14310

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