About: Local probe microscopy with interferometric monitoring of the stage nanopositioning     Goto   Sponge   NotDistinct   Permalink

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  • We present a system of positioning and interferometric monitoring of a sample position for measurements and calibration in the nanoscale in metrology. The positioning is based on a three-axis stage which allows replacing scanning by the probe of an atomic force microscope with a system with full interferometric displacement measurement. A stage with 200 μm 200 μm of horizontal travel extends also the microscope range. The stage allows positioning with sub-nanometer resolution in all three axes under a closed loop control with position detection via capacitive sensors. Interferometric system monitoring all six degrees of freedom of the stage ensures full metrological traceability of the positioning to the fundamental etalon of length and improves resolution and overall precision of the displacement monitoring.
  • We present a system of positioning and interferometric monitoring of a sample position for measurements and calibration in the nanoscale in metrology. The positioning is based on a three-axis stage which allows replacing scanning by the probe of an atomic force microscope with a system with full interferometric displacement measurement. A stage with 200 μm 200 μm of horizontal travel extends also the microscope range. The stage allows positioning with sub-nanometer resolution in all three axes under a closed loop control with position detection via capacitive sensors. Interferometric system monitoring all six degrees of freedom of the stage ensures full metrological traceability of the positioning to the fundamental etalon of length and improves resolution and overall precision of the displacement monitoring. (en)
Title
  • Local probe microscopy with interferometric monitoring of the stage nanopositioning
  • Local probe microscopy with interferometric monitoring of the stage nanopositioning (en)
skos:prefLabel
  • Local probe microscopy with interferometric monitoring of the stage nanopositioning
  • Local probe microscopy with interferometric monitoring of the stage nanopositioning (en)
skos:notation
  • RIV/00177016:_____/09:#0000355!RIV11-MSM-00177016
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(2A-1TP1/127), P(2A-3TP1/113), P(2C06012), P(FT-TA3/133), P(GA102/07/1179), P(IAA200650504), P(LC06007), Z(AV0Z20650511)
http://linked.open...iv/cisloPeriodika
  • 8
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 323985
http://linked.open...ai/riv/idVysledku
  • RIV/00177016:_____/09:#0000355
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • interferometry (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV
  • [3227B3A36442]
http://linked.open...i/riv/nazevZdroje
  • Measurement Science and Technology
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 20
http://linked.open...iv/tvurceVysledku
  • Klapetek, Petr
  • Lazar, Josef
  • Číp, Ondřej
  • Čížek, Martin
  • Šerý, Mojmír
http://linked.open...ain/vavai/riv/wos
  • 2,67514E+11
http://linked.open...n/vavai/riv/zamer
issn
  • 0957-0233
number of pages
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