About: Polyethylene naphthalate as an excellent candidate for ripple nanopatterning

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://dx.doi.org/10.1016/j.apsusc.2013.09.007
Description	The surface of polyethylene naphthalate (PEN) foils was exposed to KrF excimer laser treatment. Due to presence of condensed benzene rings has this polymer better mechanical, chemical and thermal properties in comparison to polyethylene terephthalate, which is widely applicable in electronic devices and also as tissue cell carriers. The influence of laser fluence and number of laser pulses on surface chemistry and morphology was determined. The surface morphology was studied with atomic force microscopy (AFM) in combination with scanning electron microscopy and focused ion beam (FIB-SEM). Surface wettability was characterized by the contact angle measurement. Surface chemistry was evaluated from XPS spectra. The optimal PEN process parameters with the most regular pattern were determined. The foils with optimal ripple pattern were consequently sputtered with gold nanolayers of 100 nm thickness. The parameters of ripple pattern after the metallization were introduced. It was found that the gold nanolayer is formed of electrically continuous wires, the ripple pattern was maintained. The surface of polyethylene naphthalate (PEN) foils was exposed to KrF excimer laser treatment. Due to presence of condensed benzene rings has this polymer better mechanical, chemical and thermal properties in comparison to polyethylene terephthalate, which is widely applicable in electronic devices and also as tissue cell carriers. The influence of laser fluence and number of laser pulses on surface chemistry and morphology was determined. The surface morphology was studied with atomic force microscopy (AFM) in combination with scanning electron microscopy and focused ion beam (FIB-SEM). Surface wettability was characterized by the contact angle measurement. Surface chemistry was evaluated from XPS spectra. The optimal PEN process parameters with the most regular pattern were determined. The foils with optimal ripple pattern were consequently sputtered with gold nanolayers of 100 nm thickness. The parameters of ripple pattern after the metallization were introduced. It was found that the gold nanolayer is formed of electrically continuous wires, the ripple pattern was maintained. (en)
Title	Polyethylene naphthalate as an excellent candidate for ripple nanopatterning Polyethylene naphthalate as an excellent candidate for ripple nanopatterning (en)
skos:prefLabel	Polyethylene naphthalate as an excellent candidate for ripple nanopatterning Polyethylene naphthalate as an excellent candidate for ripple nanopatterning (en)
skos:notation	RIV/60461373:22320/13:43895744!RIV14-GA0-22320___
http://linked.open...avai/predkladatel	Fakulta technologie ochrany prostředí
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GA13-06609S)
http://linked.open...iv/cisloPeriodika	PARTB
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Sajdl, Petr
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoká škola chemicko-technologická v Praze / Fakulta technologie ochrany prostředí
http://linked.open...dnocenehoVysledku	97068
http://linked.open...ai/riv/idVysledku	RIV/60461373:22320/13:43895744
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Surface properties; Sputtering; Ripples; Polyethylene naphthalate; Gold; Excimer laser (en)
http://linked.open.../riv/klicoveSlovo	Ripples Surface properties Gold Sputtering Excimer laser Polyethylene naphthalate
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[41A58FA18328]
http://linked.open...i/riv/nazevZdroje	Applied Surface Science
http://linked.open...in/vavai/riv/obor	JJ
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Příprava nano a mikrostruktur na substrátu interakcí s laserovým svazkem
http://linked.open...UplatneniVysledku	2013
http://linked.open...v/svazekPeriodika	285
http://linked.open...iv/tvurceVysledku	Kolská, Zdeňka Sajdl, Petr Slepička, Petr Švorčík, Václav Neděla, Oldřich
http://linked.open...ain/vavai/riv/wos	000326579400110
issn	0169-4332
number of pages	8 (xsd:int)
http://bibframe.org/vocab/doi	10.1016/j.apsusc.2013.09.007
http://localhost/t...ganizacniJednotka	22320

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