About: Statistics of Impact Ionization Processes in GaAsP P-N Junctions     Goto   Sponge   NotDistinct   Permalink

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Description
  • V tomto článku je podán prostředek pro statistický popis procesu nárazové ionizace v GaAs0.6P0.4 PN přechodech v silných elektrických polích pomocí modelu založeném na Markovském procesu typu generace - rekombinace. (cs)
  • In the present paper, a model which is based on Birth-and-Death type Markovian processes, is proposed as a tool for statistical description of strong-field impact ionization in GaAs0.6P0.4 diode p-n junctions. This process is termed one-dimensional stochastic generation - recombination (G-R) process. The model applies to materials in which the value of a, the impact ionization coefficient, may be considered having the same value for both conduction electrons and holes, whose strong-field drift velocity has the same value for both charge carrier types. As a random quantity to analyse, we take the total number of free charge carriers N(t) in the ionization region, which is fluctuating due to the impact ionization random process and due to the charge car rier random flow-out of the ionization region. We start from the continuity equation for statistical mean values of charge carrier concentrations, to draw up a differential equation for the statistical mean value of N(t), from which wee will derive the c
  • In the present paper, a model which is based on Birth-and-Death type Markovian processes, is proposed as a tool for statistical description of strong-field impact ionization in GaAs0.6P0.4 diode p-n junctions. This process is termed one-dimensional stochastic generation - recombination (G-R) process. The model applies to materials in which the value of a, the impact ionization coefficient, may be considered having the same value for both conduction electrons and holes, whose strong-field drift velocity has the same value for both charge carrier types. As a random quantity to analyse, we take the total number of free charge carriers N(t) in the ionization region, which is fluctuating due to the impact ionization random process and due to the charge car rier random flow-out of the ionization region. We start from the continuity equation for statistical mean values of charge carrier concentrations, to draw up a differential equation for the statistical mean value of N(t), from which wee will derive the c (en)
Title
  • Statistické charakteristiky procesu nárazové ionizace v GaAsP PN přechodech (cs)
  • Statistics of Impact Ionization Processes in GaAsP P-N Junctions
  • Statistics of Impact Ionization Processes in GaAsP P-N Junctions (en)
skos:prefLabel
  • Statistické charakteristiky procesu nárazové ionizace v GaAsP PN přechodech (cs)
  • Statistics of Impact Ionization Processes in GaAsP P-N Junctions
  • Statistics of Impact Ionization Processes in GaAsP P-N Junctions (en)
skos:notation
  • RIV/00216305:26220/03:PU39254!RIV06-GA0-26220___
http://linked.open.../vavai/riv/strany
  • 441-444
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/03/0621), Z(MSM 262200022)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 628794
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/03:PU39254
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Microplasma noise, Impulse noise, GaAsP, PN junction, Generation-recombination process (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [3C20DF860CC3]
http://linked.open...v/mistoKonaniAkce
  • Prague
http://linked.open...i/riv/mistoVydani
  • Prague
http://linked.open...i/riv/nazevZdroje
  • Proceedings of the 17th International Conference %22Noise and Fluctuation%22 ICNF 2003
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Koktavý, Pavel
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • CNRL, s.r.o.
https://schema.org/isbn
  • 80-239-1055-1
http://localhost/t...ganizacniJednotka
  • 26220
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