About: Magnetron sputtered Si-B-C-N films with high oxidation resistance and thermal stability in air at temperatures above 1500 degrees C     Goto   Sponge   Distinct   Permalink

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  • Nové čtyřsložkové materiály Si-B-C-N se stávají atraktivními pro jejich možné aplikace ve vysokoteplotním a nepříznivém prostředí. V této práci byly amorfní vrstvy Si-B-C-N deponovány na substrátech Si a SiC. (cs)
  • Novel quaternary Si-B-C-N materials are becoming increasingly attractive because of their possible high-temperature and harsh-environment applications. In the present work, amorphous Si-B-C-N films were deposited on Si and SiC substrates by reactive dc magnetron cosputtering using a single C-Si -B or B4C-Si target in nitrogen-argon gas mixtures. A fixed 75% Si fraction in the target erosion areas, a rf induced negative substrate bias voltage of -100 V, a substrate temperature of 350 degrees C, and a total pressure of 0.5 Pa were used in the depositions. The corresponding discharge and deposition characteristics (such as the ion-to-film-forming particle flux ratio, ion energy per deposited atom, and deposition rate) are presented to understand complex relationships between process parameters and film characteristics. Films deposited under optimized conditions (B4C-Si target, 50% N-2+50% Ar gas mixture), possessing a composition (in at. %).
  • Novel quaternary Si-B-C-N materials are becoming increasingly attractive because of their possible high-temperature and harsh-environment applications. In the present work, amorphous Si-B-C-N films were deposited on Si and SiC substrates by reactive dc magnetron cosputtering using a single C-Si -B or B4C-Si target in nitrogen-argon gas mixtures. A fixed 75% Si fraction in the target erosion areas, a rf induced negative substrate bias voltage of -100 V, a substrate temperature of 350 degrees C, and a total pressure of 0.5 Pa were used in the depositions. The corresponding discharge and deposition characteristics (such as the ion-to-film-forming particle flux ratio, ion energy per deposited atom, and deposition rate) are presented to understand complex relationships between process parameters and film characteristics. Films deposited under optimized conditions (B4C-Si target, 50% N-2+50% Ar gas mixture), possessing a composition (in at. %). (en)
Title
  • Magnetron sputtered Si-B-C-N films with high oxidation resistance and thermal stability in air at temperatures above 1500 degrees C
  • Magnetron sputtered Si-B-C-N films with high oxidation resistance and thermal stability in air at temperatures above 1500 degrees C (en)
  • Magnetronem nastříkané vrstvy Si-B-C-N s vysokou oxidační odolností a tepelnou stabilitou na vzduchu při teplotách nad 1500 stupňů C (cs)
skos:prefLabel
  • Magnetron sputtered Si-B-C-N films with high oxidation resistance and thermal stability in air at temperatures above 1500 degrees C
  • Magnetron sputtered Si-B-C-N films with high oxidation resistance and thermal stability in air at temperatures above 1500 degrees C (en)
  • Magnetronem nastříkané vrstvy Si-B-C-N s vysokou oxidační odolností a tepelnou stabilitou na vzduchu při teplotách nad 1500 stupňů C (cs)
skos:notation
  • RIV/61389005:_____/08:00313775!RIV09-AV0-61389005
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(AV0Z10480505), Z(MSM4977751302)
http://linked.open...iv/cisloPeriodika
  • 5
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 377465
http://linked.open...ai/riv/idVysledku
  • RIV/61389005:_____/08:00313775
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • ceramics; behavior; system (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [F938F2BDBBBF]
http://linked.open...i/riv/nazevZdroje
  • Journal of Vacuum Science & Technology A : Vacuum, Surfaces and Films
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 26
http://linked.open...iv/tvurceVysledku
  • Peřina, Vratislav
  • Vlček, J.
  • Čapek, J.
  • Čerstvý, R.
  • Zeman, P.
  • Hřeben, S.
  • Kalas, J.
  • Setsuhara, Y.
http://linked.open...ain/vavai/riv/wos
  • 000259296000001
http://linked.open...n/vavai/riv/zamer
issn
  • 0734-2101
number of pages
is http://linked.open...avai/riv/vysledek of
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