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Statements

Subject Item
n2:RIV%2F00007064%3AK01__%2F09%3A%230000325%21RIV10-MV0-K01_____
rdf:type
skos:Concept n17:Vysledek
dcterms:description
Scanning electron microscopy (SEM) can be labelled as an analytical method in the field of forensic science. It has developed into one of basic screenings that is employed for primary information about unknown samples and materials. Majority of casework in forensic science deals with determination, description and comparisons of practically any phases, which can come into contact with persons or objects. Generally, both materials of natural origin and any materials produced by human activities can be encountered (meant in wide available interpretation). In practise, any items can be delivered to a forensic lab (ranging from a fragment of ancient vessels, data records, documents, to materials for high tech semiconductors). Scanning electron microscopy (SEM) can be labelled as an analytical method in the field of forensic science. It has developed into one of basic screenings that is employed for primary information about unknown samples and materials. Majority of casework in forensic science deals with determination, description and comparisons of practically any phases, which can come into contact with persons or objects. Generally, both materials of natural origin and any materials produced by human activities can be encountered (meant in wide available interpretation). In practise, any items can be delivered to a forensic lab (ranging from a fragment of ancient vessels, data records, documents, to materials for high tech semiconductors).
dcterms:title
Forensic Science Scanning Electron Microscopy and News in this Field Forensic Science Scanning Electron Microscopy and News in this Field
skos:prefLabel
Forensic Science Scanning Electron Microscopy and News in this Field Forensic Science Scanning Electron Microscopy and News in this Field
skos:notation
RIV/00007064:K01__/09:#0000325!RIV10-MV0-K01_____
n3:aktivita
n18:P
n3:aktivity
P(RN19982000005), P(RN20052005001), P(VD20062008B10), P(VD20072010B15)
n3:cisloPeriodika
Supp S2
n3:dodaniDat
n10:2010
n3:domaciTvurceVysledku
n12:9814086 n12:8249946 n12:3149722
n3:druhVysledku
n16:J
n3:duvernostUdaju
n14:S
n3:entitaPredkladatele
n8:predkladatel
n3:idSjednocenehoVysledku
315357
n3:idVysledku
RIV/00007064:K01__/09:#0000325
n3:jazykVysledku
n4:eng
n3:klicovaSlova
forensic science; SEM; FIB; nanoparticles
n3:klicoveSlovo
n5:forensic%20science n5:nanoparticles n5:SEM n5:FIB
n3:kodStatuVydavatele
GB - Spojené království Velké Británie a Severního Irska
n3:kontrolniKodProRIV
[F11AE242245C]
n3:nazevZdroje
Microscopy and Microanalysis
n3:obor
n15:CB
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:projekt
n7:RN19982000005 n7:RN20052005001 n7:VD20072010B15 n7:VD20062008B10
n3:rokUplatneniVysledku
n10:2009
n3:svazekPeriodika
Volume 15
n3:tvurceVysledku
Grünwaldová, Veronika Turková, Ivana Kotrlý, Marek
s:issn
1431-9276
s:numberOfPages
2
n13:organizacniJednotka
K01