. "Nebyly vytvo\u0159eny kvalitn\u00ED publika\u010Dn\u00ED v\u00FDstupy prokazuj\u00EDc\u00ED spln\u011Bn\u00ED c\u00EDl\u016F projektu."@cs . . "2011-12-31+01:00"^^ . . "Podstatou projektu je studium vlastnost\u00ED tenk\u00FDch monokrystal\u016F k\u0159em\u00EDku (Si pl\u00E1tk\u016F) po vystaven\u00ED teplotn\u00EDm a mechanick\u00FDm stres\u016Fm vedouc\u00EDm k jejich plastick\u00E9 deformaci. Prost\u0159edkem je v\u00FDzkum v\u011Bt\u0161inou dosud neprob\u00E1dan\u00FDch \u010Di nevyu\u017E\u00EDvan\u00FDch mo\u017Enost\u00ED tvarov\u00E1n\u00ED Si pl\u00E1tk\u016F do p\u0159esn\u00FDch optick\u00FDch ploch a struktur. Vlastn\u00EDmu tvarov\u00E1n\u00ED Si pl\u00E1tk\u016F za pou\u017Eit\u00ED vhodn\u00FDch teplot, tlak\u016F a ochrann\u00E9 atmosf\u00E9ry bude p\u0159edch\u00E1zet teoretick\u00E1 studie s rozs\u00E1hl\u00FDm vyu\u017Eit\u00EDm po\u010D\u00EDta\u010Dov\u00E9ho modelov\u00E1n\u00ED. Pot\u0159ebn\u00FD software bude pr\u016Fb\u011B\u017En\u011B vyv\u00EDjen. Vnit\u0159n\u00ED struktura a povrchov\u00E9 vlastnosti deformovan\u00FDch Si pl\u00E1tk\u016F budou zkoum\u00E1ny s pou\u017Eit\u00EDm rentgenov\u00E9 difrakce, rentgenov\u00E9 reflexe, optick\u00E9 interferometrie, p\u0159esn\u00FDch metod m\u011B\u0159en\u00ED, topografie povrchu apod. T\u00E9\u017E budou studov\u00E1ny zp\u016Fsoby dal\u0161\u00EDho zlep\u0161ov\u00E1n\u00ED kvality Si pl\u00E1tk\u016F spolu se souvisej\u00EDc\u00EDmi metodami m\u011B\u0159en\u00ED. V\u00FDsledky umo\u017En\u00ED v\u00FDvoj nov\u00FDch typ\u016F rentgenov\u00E9 optiky a optick\u00FDch struktur pro d\u016Fle\u017Eit\u00E9 aplikace, jako nap\u0159. velk\u00E9 kosmick\u00E9 rentgenov\u00E9 teleskopy a kolektory sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F." . . "Quality publication outputs demonstrating compliance with project objectives were not created."@en . . . . "Materi\u00E1lov\u00E9 a rentgenooptick\u00E9 vlastnosti tvarovan\u00FDch k\u0159em\u00EDkov\u00FDch pl\u00E1tk\u016F" . "silicon wafers" . "37"^^ . "2013-06-28+02:00"^^ . "0"^^ . "37"^^ . . "silicon wafers; X-ray optics"@en . . "The project is based on a study of properties of thin Si monocrystals (Si wafers) after their exposure to thermal and mechanical stresses leading to their plastic deformation. Research will be done through yet mostly unexplored or unexploited possibilities of forming of Si wafers into precise optical surfaces and structures. Theoretical study using computer modeling will precede the Si wafers forming under suitable temperatures, pressures and protective atmosphere. The necessary software will be developed. Internal structure and surface properties of deformed Si wafers will be researched with use of X-ray diffraction, X-ray reflection, optical interferometry, precise optical methods, surface topography etc. Methods of further quality improvement of Si wafers will be also studied together with relevant measurements methods. Results will allow design of new types of X-ray optics and optical structures for important applications, eg. cosmic X-ray telescopes and solar collectors."@en . . . . "3"^^ . "2007-01-01+01:00"^^ . "Material and X-Ray Optical Properties of Formed Silicon Monocrystals"@en . "1"^^ . . . . "IAAX01220701" . "2011-03-18+01:00"^^ . "http://www.isvav.cz/projectDetail.do?rowId=IAAX01220701"^^ . . . .