<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91943>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#code>	"C91943"^^<http://www.w3.org/2001/XMLSchema#string> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91943>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P90>	"<n0:ComplexTerm xmlns:n0=\"http://ncicb.nci.nih.gov/xml/owl/EVS/ComplexProperties.xsd#\"><n0:term-name>IMPACT TESTING</n0:term-name><n0:term-group>PT</n0:term-group><n0:term-source>FDA</n0:term-source><n0:source-code>3302</n0:source-code></n0:ComplexTerm>" .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91943>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P207>	"C2984676"^^<http://www.w3.org/2001/XMLSchema#string> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91943>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P90>	"<n0:ComplexTerm xmlns:n0=\"http://ncicb.nci.nih.gov/xml/owl/EVS/ComplexProperties.xsd#\"><n0:term-name>Device Impact Testing Evaluation Method</n0:term-name><n0:term-group>PT</n0:term-group><n0:term-source>NCI</n0:term-source></n0:ComplexTerm>" .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91943>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#A10>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C92005> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91943>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/2002/07/owl#Class> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91943>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P325>	"<n0:ComplexDefinition xmlns:n0=\"http://ncicb.nci.nih.gov/xml/owl/EVS/ComplexProperties.xsd#\"><n0:def-definition>Testing the device&#39;s response to a suddenly applied stress. The test ascertains whether the material is tough or brittle.</n0:def-definition><n0:def-source>FDA</n0:def-source></n0:ComplexDefinition>" .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91943>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P322>	"FDA"^^<http://www.w3.org/2001/XMLSchema#string> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91943>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#A8>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91800> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91943>	<http://www.w3.org/2000/01/rdf-schema#label>	"Device Impact Testing Evaluation Method"^^<http://www.w3.org/2001/XMLSchema#string> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91943>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P106>	"Functional Concept"^^<http://www.w3.org/2001/XMLSchema#string> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91943>	<http://www.w3.org/2000/01/rdf-schema#subClassOf>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C54028> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91943>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P108>	"Device Impact Testing Evaluation Method"^^<http://www.w3.org/2001/XMLSchema#string> .