<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91914>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/2002/07/owl#Class> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91914>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P322>	"FDA"^^<http://www.w3.org/2001/XMLSchema#string> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91914>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P90>	"<n0:ComplexTerm xmlns:n0=\"http://ncicb.nci.nih.gov/xml/owl/EVS/ComplexProperties.xsd#\"><n0:term-name>Device Current Leakage Testing Evaluation Method</n0:term-name><n0:term-group>PT</n0:term-group><n0:term-source>NCI</n0:term-source></n0:ComplexTerm>" .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91914>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#A10>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91919> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91914>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P207>	"C2984647"^^<http://www.w3.org/2001/XMLSchema#string> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91914>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#A8>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91800> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91914>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P325>	"<n0:ComplexDefinition xmlns:n0=\"http://ncicb.nci.nih.gov/xml/owl/EVS/ComplexProperties.xsd#\"><n0:def-definition>Testing to detect the amount of electricity leakage from the device.</n0:def-definition><n0:def-source>FDA</n0:def-source></n0:ComplexDefinition>" .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91914>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P108>	"Device Current Leakage Testing Evaluation Method"^^<http://www.w3.org/2001/XMLSchema#string> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91914>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#code>	"C91914"^^<http://www.w3.org/2001/XMLSchema#string> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91914>	<http://www.w3.org/2000/01/rdf-schema#label>	"Device Current Leakage Testing Evaluation Method"^^<http://www.w3.org/2001/XMLSchema#string> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91914>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P90>	"<n0:ComplexTerm xmlns:n0=\"http://ncicb.nci.nih.gov/xml/owl/EVS/ComplexProperties.xsd#\"><n0:term-name>CURRENT LEAKAGE TESTING</n0:term-name><n0:term-group>PT</n0:term-group><n0:term-source>FDA</n0:term-source><n0:source-code>3279</n0:source-code></n0:ComplexTerm>" .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91914>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#P106>	"Functional Concept"^^<http://www.w3.org/2001/XMLSchema#string> .
<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C91914>	<http://www.w3.org/2000/01/rdf-schema#subClassOf>	<http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C54028> .