"A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda<100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly (methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9+-7.5) nm and ~2 mJ.cm-2, respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at um resolution by a method developed here."@en . . "Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids"@cs . "8"^^ . "Jurek, M." . "Toleikis, S." . "Koptyaev, S." . "Sobierajski, R." . "Caleman, C." . . . "2"^^ . . . "London, R. A." . . "15" . "X-ray laser"@en . "Pelka, J. B." . "Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids"@en . . "Tschentscher, T." . "P(1P04LA235), P(KAN300100702), P(LC510), P(LC528), Z(AV0Z10100523), Z(AV0Z40400503)" . . "RIV/68407700:21460/07:12130223" . . "6036;6043" . "1094-4087" . "Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids" . "RIV/68407700:21460/07:12130223!RIV08-AV0-21460___" . "Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids"@cs . "Chalupsk\u00FD, Jarom\u00EDr" . "Velyhan, A." . "[09F952157376]" . . "US - Spojen\u00E9 st\u00E1ty americk\u00E9" . "Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids"@en . "Krasa, J." . "10" . . "Nen\u00ED k dispozici"@cs . "Tronnier, A." . . "21460" . "Cihelka, J." . "Meyer-ter-Vehn, J." . . "Tiedtke, K." . "Bergh, M." . "413316" . "Sokolowski-Tinten, K." . "29"^^ . . . "Juha, L." . "Bionta, R. M." . "Hajkova, V." . "Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids" . "Wabnitz, H." . . "Zastrau, U." . "Chapman, H." . "Optics Express" . "A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda<100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly (methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9+-7.5) nm and ~2 mJ.cm-2, respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at um resolution by a method developed here." . "Stojanovic, N." . . "Kuba, Jaroslav" . . . "Nietubyc, J." . "Hajdu, J." . "Krzywinski, J." . . "Hau-Riege, S. P." .