. "[BBB4996DB384]" . "Microwave interferometric method for metal sheet thickness measurement"@en . "3"^^ . "Seattle" . "New Jersey" . . "A new microwave method capable of contactless thickness measurement of metal sheets with high resolution has been proposed. First experimental results in X-band are reported. The method is based on precise interferometric phase evaluation of a signal reflected step by step from two surfaces of a metal sheet whose thickness is to be measured. This is achieved using interference between the reflected and reference signals. Micrometer resolution at 10 GHz can be expected."@en . . . "21230" . . . . "2013-06-03+02:00"^^ . "Microwave interferometric method for metal sheet thickness measurement" . "2"^^ . . . "Contact less; High resolution; Interferometric methods; Interferometric phase; Microwave methods; Reference signals; Sheet thickness"@en . . "978-1-4673-4982-6" . . "1"^^ . "RIV/68407700:21230/13:00213246!RIV14-MSM-21230___" . "88258" . . "I" . "000333388300017" . "10.1109/ARFTG.2013.6579036" . . . "\u0160kvor, Zbyn\u011Bk" . "A new microwave method capable of contactless thickness measurement of metal sheets with high resolution has been proposed. First experimental results in X-band are reported. The method is based on precise interferometric phase evaluation of a signal reflected step by step from two surfaces of a metal sheet whose thickness is to be measured. This is achieved using interference between the reflected and reference signals. Micrometer resolution at 10 GHz can be expected." . "Hoffmann, Karel" . . . . "RIV/68407700:21230/13:00213246" . "Microwave interferometric method for metal sheet thickness measurement" . "81st ARFTG Microwave Measurement Conference Proceedings" . . . . "Microwave interferometric method for metal sheet thickness measurement"@en . "IEEE" .