. "The article brings upgraded version of a diagnostic system designed for measurements of crystalline silicon solar cell parameters. Shunt resistance, the most affecting deep energy level center and also current-voltage characteristic with its all included parameters are available due to the proposed diagnostic system. New computer program has been created and together with innovated hardware implemented to obtain more accurate, faster and more user-friendly measurements. The diagnostic system was used for investigation of monocrystalline and polycrystalline solar cells. The unlighted samples were measured by a four probe method, exposed to increased temperature and measured again the same way."@en . "2"^^ . . . "Pikna, Peter" . . "RIV/68407700:21230/11:00186836" . . "Ku\u0159\u00EDk, Ond\u0159ej" . "2"^^ . "POSTER 2011 - 15th International Student Conference on Electrical Engineering" . . . "Diagnostic System for Measurement of Crystalline Silicon Solar Cells"@en . "S" . "[441199AE9004]" . "978-80-01-04806-1" . "5"^^ . . "RIV/68407700:21230/11:00186836!RIV12-MSM-21230___" . . . "Diagnostic System for Measurement of Crystalline Silicon Solar Cells" . "Prague" . . "\u010Cesk\u00E9 vysok\u00E9 u\u010Den\u00ED technick\u00E9 v Praze. Fakulta elektrotechnick\u00E1" . . . . "Diagnostic System for Measurement of Crystalline Silicon Solar Cells" . "2011-05-12+02:00"^^ . "Pikna, Peter" . "The article brings upgraded version of a diagnostic system designed for measurements of crystalline silicon solar cell parameters. Shunt resistance, the most affecting deep energy level center and also current-voltage characteristic with its all included parameters are available due to the proposed diagnostic system. New computer program has been created and together with innovated hardware implemented to obtain more accurate, faster and more user-friendly measurements. The diagnostic system was used for investigation of monocrystalline and polycrystalline solar cells. The unlighted samples were measured by a four probe method, exposed to increased temperature and measured again the same way." . "crystalline silicon; solar cell parameters; deep levels in silicon; shunt resistance; recombination; diagnostic system"@en . "194211" . . "Diagnostic System for Measurement of Crystalline Silicon Solar Cells"@en . "21230" . "Praha" . . . . .