"[63A8CF31FCE8]" . . "Measurement of Extreme Impedances"@en . . . . "P(GD102/08/H027), Z(MSM6840770015)" . "4"^^ . . "calibration; impedance measurement; microwave circuits; microwave measurements; nanotechnology"@en . . "RIV/68407700:21230/10:00167965" . "2010-04-19+02:00"^^ . "270009" . . "2"^^ . . . . "2"^^ . . . "Measurement of Extreme Impedances" . "Hoffmann, Karel" . "Measurement of Extreme Impedances"@en . "978-1-4244-6351-0" . . "21230" . "This paper provides an experimental verification of a novel method for measurement of extreme impedances which was theoretically described earlier. In this paper experiments proving that the method can significantly improve stability of a measurement system are described. Using Agilent PNA E8364A vector network analyzer the method is able to measure reflection coefficient with stability improved 36-times in magnitude and 354-times in phase compared to the classical method of reflection coefficient measurement. Further, validity of the error model and related equations stated in the earlier paper are verified by real measurement of SMD resistors (size 0603) in microwave test fixture. Values of the measured SMD resistors range from 12 k\u03A9 up to 330 k\u03A9. A novel calibration technique using three different resistors as calibration standards is used. The measured values of impedances reasonably agree with assumed values."@en . "Brno" . . . "Brno" . . "Randus, Martin" . "Proceedings of 15th Conference on Microwave Techniques COMITE 2010" . . . "This paper provides an experimental verification of a novel method for measurement of extreme impedances which was theoretically described earlier. In this paper experiments proving that the method can significantly improve stability of a measurement system are described. Using Agilent PNA E8364A vector network analyzer the method is able to measure reflection coefficient with stability improved 36-times in magnitude and 354-times in phase compared to the classical method of reflection coefficient measurement. Further, validity of the error model and related equations stated in the earlier paper are verified by real measurement of SMD resistors (size 0603) in microwave test fixture. Values of the measured SMD resistors range from 12 k\u03A9 up to 330 k\u03A9. A novel calibration technique using three different resistors as calibration standards is used. The measured values of impedances reasonably agree with assumed values." . . . "Measurement of Extreme Impedances" . "RIV/68407700:21230/10:00167965!RIV11-GA0-21230___" . . "Vysok\u00E9 u\u010Den\u00ED technick\u00E9 v Brn\u011B. Fakulta elektrotechniky a komunika\u010Dn\u00EDch technologi\u00ED. \u00DAstav radioelektroniky" .