"Laborato\u0159 153" . "Z(MSM6840770021)" . "RIV/68407700:21230/08:03149259!RIV09-MSM-21230___" . "[79DD15E5D05F]" . "1"^^ . "M\u011B\u0159i\u010D optick\u00E9 transparence tenk\u00FDch vrstev" . . "378579" . "Sedl\u00E1\u010Dek, Josef" . "Sedl\u00E1\u010Dek, Radek" . "2"^^ . . "Microprocessor controlled measuring instrument for optical transparency measurement of ultra thin metallic and composite films. Optical transparency is measured at three wavelengths 529 nm, 626 nm and 850 nm. This prototype is a partial result of research project VZS|13113|ext:MSM6840770021|FIS:34-05212|21 Diagnostika materi\u00E1l\u016F, partial task : development of thin film flexible electrode for organic solar cell."@en . "M\u011B\u0159i\u010D optick\u00E9 transparence tenk\u00FDch vrstev"@cs . "RIV/68407700:21230/08:03149259" . "Thin Films Optical Transparency Meter"@en . "Mikroprocesorem \u0159\u00EDzen\u00FD m\u011B\u0159ic\u00ED p\u0159\u00EDstroj pro m\u011B\u0159en\u00ED bodov\u00E9 optick\u00E9 propustnosti ultra tenk\u00FDch metalick\u00FDch a polymern\u00EDch kompozitn\u00EDch vrstev. Optick\u00E1 propustnost je m\u011B\u0159ena na vlnov\u00FDch d\u00E9lk\u00E1ch 529 nm, 626 nm a 850 nm s rozli\u0161en\u00EDm 0,1% v cel\u00E9m rozsahu. Funk\u010Dn\u00ED vzorek vznikl v r\u00E1mci \u0159e\u0161en\u00ED v\u00FDzkumn\u00E9ho z\u00E1m\u011Bru VZS|13113|ext:MSM6840770021|FIS:34-05212|21 Diagnostika materi\u00E1l\u016F, v\u00FDvoje tenkovrstvov\u00E9 ohebn\u00E9 elektrody organick\u00E9ho sol\u00E1rn\u00EDho \u010Dl\u00E1nku."@cs . . . "21230" . . "Mikroprocesorem \u0159\u00EDzen\u00FD m\u011B\u0159ic\u00ED p\u0159\u00EDstroj pro m\u011B\u0159en\u00ED bodov\u00E9 optick\u00E9 propustnosti ultra tenk\u00FDch metalick\u00FDch a polymern\u00EDch kompozitn\u00EDch vrstev. Optick\u00E1 propustnost je m\u011B\u0159ena na vlnov\u00FDch d\u00E9lk\u00E1ch 529 nm, 626 nm a 850 nm s rozli\u0161en\u00EDm 0,1% v cel\u00E9m rozsahu. Funk\u010Dn\u00ED vzorek vznikl v r\u00E1mci \u0159e\u0161en\u00ED v\u00FDzkumn\u00E9ho z\u00E1m\u011Bru VZS|13113|ext:MSM6840770021|FIS:34-05212|21 Diagnostika materi\u00E1l\u016F, v\u00FDvoje tenkovrstvov\u00E9 ohebn\u00E9 elektrody organick\u00E9ho sol\u00E1rn\u00EDho \u010Dl\u00E1nku." . . . . . "M\u011B\u0159i\u010D optick\u00E9 transparence tenk\u00FDch vrstev"@cs . "solar cell; thin films; transparency"@en . . . . . "20000.- K\u010D" . . . . "13113/14/2008" . "Thin Films Optical Transparency Meter"@en . . "M\u011B\u0159i\u010D optick\u00E9 transparence tenk\u00FDch vrstev" . . "P\u0159\u00EDstroj umo\u017E\u0148uje bodov\u00E9 m\u011B\u0159en\u00ED optick\u00E9 propustnosti vzorku na t\u0159ech vlnov\u00FDch d\u00E9lk\u00E1ch : 569 nm, 626 nm, 850 nm s rozli\u0161en\u00EDm 0,1% v cel\u00E9m rozsahu T (0-100 %)." .