"Posteriori Frequency Spectrum Correction for Test Signal Imperfections in ADC Testing"@en . "2007-05-01+02:00"^^ . "RIV/68407700:21230/07:03129821" . "Korekce nedokonalost\u00ED testovac\u00EDho sign\u00E1lu v kmito\u010Dtov\u00E9m spektru pro testov\u00E1n\u00ED A\u010C p\u0159evodn\u00EDk\u016F"@cs . "Warsaw" . "442789" . . "Warsaw" . "ADC testing; frequency; signal filtering; test signal"@en . . . "[3B19C2709D41]" . . "1"^^ . "Posteriori Frequency Spectrum Correction for Test Signal Imperfections in ADC Testing" . "RIV/68407700:21230/07:03129821!RIV08-MSM-21230___" . "4"^^ . . "4"^^ . "IMTC/2007 IEEE Instrumentation and Measurement Technology Conference Proceedings" . "Barbara, F." . "IEEE" . "978-1-4244-0588-6" . . "Z(MSM6840770015)" . . "Nedostatek kvalitn\u00EDch sign\u00E1l\u016F pro testov\u00E1n\u00ED A\u010C p\u0159evodn\u00EDk\u016F ji\u017E del\u0161\u00ED \u010Das podn\u011Bcuje v\u00FDvoj alternativn\u00EDch metod zalo\u017Een\u00FDch na korekci nedokonalost\u00ED testovac\u00EDho sign\u00E1lu. N\u011Bkolik druh\u016F korekc\u00ED v kmito\u010Dtov\u00E9 dom\u00E9n\u011B bylo ji\u017E analyzov\u00E1no ve v\u011Bdeck\u00FDch publikac\u00EDch. Nicm\u00E9n\u011B, tyto korekce bu\u010F vy\u017Eaduj\u00ED mnoho vn\u011Bj\u0161\u00EDch sou\u010D\u00E1stek, jejich\u017E n\u00E1vrh m\u016F\u017Ee b\u00FDt komplikovan\u011Bj\u0161\u00ED, nebo nebyly dosud analyzov\u00E1ny v praktick\u00FDch podm\u00EDnk\u00E1ch. Z tohoto d\u016Fvodu je v tomto p\u0159\u00EDsp\u011Bvku jedna z v\u011Bdeck\u00FDch publikac\u00ED analyzov\u00E1na a roz\u0161\u00ED\u0159ena pro praktick\u00E9 u\u017Eit\u00ED a jsou zde tak\u00E9 uvedeny v\u00FDsledky m\u011B\u0159en\u00ED na re\u00E1ln\u00E9m A\u010C p\u0159evodn\u00EDku."@cs . "Dallet, D." . . . "Posteriori Frequency Spectrum Correction for Test Signal Imperfections in ADC Testing" . "Ne\u010D\u00EDslov\u00E1no" . . "Shitikov, V." . "Korekce nedokonalost\u00ED testovac\u00EDho sign\u00E1lu v kmito\u010Dtov\u00E9m spektru pro testov\u00E1n\u00ED A\u010C p\u0159evodn\u00EDk\u016F"@cs . "Slepi\u010Dka, David" . . "The lack of a precise stimulus for ADC testing has initiated many researches of alternative methods based on posteriori correction of the measured signal. Several types of correction in the frequency domain have already been analyzed in e.g. [1], [2]. However, these corrections either require many external components of which design could also be more complex [2] or were not analyzed in practical conditions yet [1]. The latter method is therefore analyzed and extended in this paper for the practical usage and the results of measurement on a real ADC are shown."@en . . . "The lack of a precise stimulus for ADC testing has initiated many researches of alternative methods based on posteriori correction of the measured signal. Several types of correction in the frequency domain have already been analyzed in e.g. [1], [2]. However, these corrections either require many external components of which design could also be more complex [2] or were not analyzed in practical conditions yet [1]. The latter method is therefore analyzed and extended in this paper for the practical usage and the results of measurement on a real ADC are shown." . "21230" . "Posteriori Frequency Spectrum Correction for Test Signal Imperfections in ADC Testing"@en . . . . .