"Samoeinn\u00E9 testov\u00E1n\u00ED SoC obvodu s redukovanou potoebou pameti a minimalizovan\u00FDm hardwarovym po3adavkem"@cs . . . "Jarkovsk\u00FD, M." . "2006-10-04+02:00"^^ . "21230" . "Not available"@en . . . . . . "Nov\u00E1k, Ond\u0159ej" . "Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead" . "Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead"@en . "Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead"@en . "5"^^ . "IEEE Computer Society" . "Mader, Z." . "El\u00E1nek popisuje metodologi ivytvooen\u00ED vestavin\u00E9ho diagnostick\u00E9ho syst\u00E9mu do Soc obvodu."@cs . "Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead" . "Samoeinn\u00E9 testov\u00E1n\u00ED SoC obvodu s redukovanou potoebou pameti a minimalizovan\u00FDm hardwarovym po3adavkem"@cs . "9"^^ . . . . "1"^^ . "0-7695-2706-X" . "This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores designed according to the IEEE 1500 standard. The system spares memory and keeps acceptable test access mechanism requirements. The diagnostic system uses built-in processor for test control and the embedded RAM memory for storing both the compressed test vectors and the partial reconfiguration bit streams."@en . . . "RIV/68407700:21230/06:03121303!RIV07-GA0-21230___" . "Jen\u00EDeek, J." . "Arlington" . . . "Los Alamitos" . "RIV/68407700:21230/06:03121303" . "P(1QS108040510), P(GA102/04/2137)" . "This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores designed according to the IEEE 1500 standard. The system spares memory and keeps acceptable test access mechanism requirements. The diagnostic system uses built-in processor for test control and the embedded RAM memory for storing both the compressed test vectors and the partial reconfiguration bit streams." . "300 ; 308" . . "The 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems" . "Pl\u00EDva, Z." . "498808" . "[CA0C87BF52EC]" .