"1"^^ . "[3395B565F436]" . "Scan Based Circuits with Low Power Consumption" . "21230" . . "2006-09-15+02:00"^^ . "2"^^ . . "206 ; 211" . "Pl\u00EDva, Z." . . "498480" . "In this paper we present a low power scan design method. In order to maximize power savings and minimize the hardware overhead we have proposed a modified RAS diagnostic access method, which can be used together with the BS."@en . "6"^^ . "Obvody se s\u00E9riov\u00FDm diagnostick\u00FDm po\u00EDstupem a sn\u00ED3enou spotoebou"@cs . . "In this paper we present a low power scan design method. In order to maximize power savings and minimize the hardware overhead we have proposed a modified RAS diagnostic access method, which can be used together with the BS." . . "Kharkov Institute of Physics and Technology" . . "P(1QS108040510), P(GA102/04/2137)" . "Sochi" . . "RIV/68407700:21230/06:03120660" . . "966-659-124-3" . "RIV/68407700:21230/06:03120660!RIV07-GA0-21230___" . "Scan Based Circuits with Low Power Consumption" . "Kharkov" . . "Scan Based Circuits with Low Power Consumption"@en . . "Not available"@en . "Obvody se s\u00E9riov\u00FDm diagnostick\u00FDm po\u00EDstupem a sn\u00ED3enou spotoebou"@cs . . . "Scan Based Circuits with Low Power Consumption"@en . . "El\u00E1nek popisuje novou diagnostickou metodu zalo3enou na principu RAS. Nov\u00E1 metoda umo3ouje sn\u00ED3it spotoebu energie poi testov\u00E1n\u00ED."@cs . . "Proceedings of the IEEE East-West Design & Test International Workshop" . . "Nov\u00E1k, Ond\u0159ej" .