"Measurement and Model Indentification of Semicoductor Devices"@en . "529163" . "V \u010Dl\u00E1nku je prezentov\u00E1na optimaliza\u010Dn\u00ED metoda, kter\u00E1 umo\u017E\u0148uje identifikaci komplikovan\u00FDch model\u016F prvk\u016F relativn\u011B mal\u00FDm po\u010Dtem iterac\u00ED. Algoritmus byl implementov\u00E1n v programu C.I.A. (Circuit Interactive Analyzer)."@cs . . . . . "S" . "2"^^ . "Measurement and Model Indentification of Semicoductor Devices"@en . "In the paper, an optimization method is presented which is usable for identifications of even very complicated models with a relatively small number of iterations. The algorithm has been implemented into the original software tool called C.I.A. (Circuit Interactive Analyzer) into its static and dynamic analysis modes. Hence, the identification is able to identify both DC and capacitance models of semiconductor devices. The process is demonstrated in the paper using various transistors."@en . "M\u011B\u0159en\u00ED a identifikace model\u016F polovodi\u010Dov\u00FDch prvk\u016F"@cs . . "In the paper, an optimization method is presented which is usable for identifications of even very complicated models with a relatively small number of iterations. The algorithm has been implemented into the original software tool called C.I.A. (Circuit Interactive Analyzer) into its static and dynamic analysis modes. Hence, the identification is able to identify both DC and capacitance models of semiconductor devices. The process is demonstrated in the paper using various transistors." . "2"^^ . "Praha" . "6"^^ . "Gr\u00E1bner, Martin" . "960-8457-13-0" . "M\u011B\u0159en\u00ED a identifikace model\u016F polovodi\u010Dov\u00FDch prvk\u016F"@cs . . "RIV/68407700:21230/05:03107848!RIV09-MSM-21230___" . . . "Athens" . "BJT; MOSFET; Modeling; measurement; optimization; parameter extraction; semiconductor device"@en . . "2005-03-13+01:00"^^ . "RIV/68407700:21230/05:03107848" . . . . . "Measurement and Model Indentification of Semicoductor Devices" . "Dobe\u0161, Josef" . "21230" . . . . . "Measurement and Model Indentification of Semicoductor Devices" . "[E4AC0E4767F6]" . "AEE\u00B405 - Proceedings of the 4th WSEAS International Conference on: Applications of Electrical Engineering" . . . "000230049300060" . . "WSEAS Press" .