"\u017Dilinsk\u00E1 univerzita v \u017Diline" . "6"^^ . "DLTS Measurement; Silicon Detector; Neutrons Damaged"@en . "DLTS is one of several methods for detecting and characterizing deep levels in semiconductors. Its major strength is that it is spectroscopic, i.e. it gives a unique line or peak for each deep level detected, in a way which makes it quick and easy to relate the spectrum to the concentration and energy of each defect - at least in quantitative sense. Quantitative information is obtained from the spectra with a small amount of analysis and the signatures of common defects."@en . "Proceedings of the 17th International Conference on Applied Physics of Condensed Matter" . "DLTS Measurement of Energetic Levels in Silicon Detector Damaged by Neutrons" . . . . "RIV/68407700:21220/11:00189607!RIV12-MSM-21220___" . "Nov\u00FD Smokovec" . "DLTS Measurement of Energetic Levels in Silicon Detector Damaged by Neutrons" . . "978-80-554-0386-1" . . . . "DLTS Measurement of Energetic Levels in Silicon Detector Damaged by Neutrons"@en . . . . "DLTS is one of several methods for detecting and characterizing deep levels in semiconductors. Its major strength is that it is spectroscopic, i.e. it gives a unique line or peak for each deep level detected, in a way which makes it quick and easy to relate the spectrum to the concentration and energy of each defect - at least in quantitative sense. Quantitative information is obtained from the spectra with a small amount of analysis and the signatures of common defects." . . "DLTS Measurement of Energetic Levels in Silicon Detector Damaged by Neutrons"@en . . "Chren, Dominik" . "Dammer, Ji\u0159\u00ED" . "2011-06-22+02:00"^^ . "Vlk, Josef" . . "4"^^ . "21220" . . "195084" . . . "Z(MSM6840770029)" . "4"^^ . "RIV/68407700:21220/11:00189607" . . "\u017Dilina" . "Sopko, V\u00EDt" . "Kohout, Zden\u011Bk" . . . "Sopko, Bruno" . "[53886F52A13C]" . .