"Current-voltage measurements as well as \u03B1-particle and photon detection were utilized to an investigation of a novel low work function Mg-metallization in semi-insulating (SI) GaAs. An anomalous decrease of the reverse current has been observed with such contact in comparison with the high work function, Pt Schottky barrier. Possible explanation relates likely to the creation of quasi-degenerate region, containing accumulated electrons, at the Mg/SI-GaAs interface."@en . "Bratislava" . "M/SI-GaAs/M diode: Role of the metal contact in electrical transport, \u03B1-particle and photon detection" . "978-1-4799-5474-2" . . "Oswald, Ji\u0159\u00ED" . "RIV/68378271:_____/14:00439987" . "M/SI-GaAs/M diode: Role of the metal contact in electrical transport, \u03B1-particle and photon detection"@en . . "M/SI-GaAs/M diode: Role of the metal contact in electrical transport, \u03B1-particle and photon detection"@en . . "[69DA3B064515]" . "2014-10-20+02:00"^^ . . "Za\u0165ko, B." . "Kov\u00E1\u010D, J." . . "Ne\u010Das, V." . . "30901" . "Dubeck\u00FD, F." . "Hub\u00EDk, Pavel" . . . "RIV/68378271:_____/14:00439987!RIV15-AV0-68378271" . . . . "M/SI-GaAs/M diode: Role of the metal contact in electrical transport, \u03B1-particle and photon detection" . . . "4"^^ . "3"^^ . "Gombia, E." . "Kindl, Dobroslav" . . "current-voltage measurements; GaAs; radiation detectors"@en . . "Vanko, G." . "10.1109/ASDAM.2014.6998643" . "Current-voltage measurements as well as \u03B1-particle and photon detection were utilized to an investigation of a novel low work function Mg-metallization in semi-insulating (SI) GaAs. An anomalous decrease of the reverse current has been observed with such contact in comparison with the high work function, Pt Schottky barrier. Possible explanation relates likely to the creation of quasi-degenerate region, containing accumulated electrons, at the Mg/SI-GaAs interface." . "Slovensk\u00E1 technick\u00E1 univerzita v Bratislave" . "\u0160ag\u00E1tov\u00E1, A." . "Smolenice" . "I" . . "ASDAM 2014- Conference Proceedings: The 10th International Conference on Advanced Semiconductor Devices and Microsystems" . . "10"^^ .