"I, P(GA14-15357S), P(GAP108/12/0996)" . "10"^^ . "Yamada, T." . "Rezek, Bohuslav" . "[A3A27E53378A]" . . "Microscopically inhomogeneous electronic and material properties arising during thermal and plasma CVD of graphene" . "2050-7526" . . "000343755800014" . "\u010Cerm\u00E1k, Jan" . "Microscopically inhomogeneous electronic and material properties arising during thermal and plasma CVD of graphene"@en . "RIV/68378271:_____/14:00436442" . . . "5"^^ . "GB - Spojen\u00E9 kr\u00E1lovstv\u00ED Velk\u00E9 Brit\u00E1nie a Severn\u00EDho Irska" . . "29225" . . "2" . "graphene; Raman micro-mapping; atomic force microscopy; AFM phase imaging; current-sensing AFM"@en . . . "Microscopically inhomogeneous electronic and material properties arising during thermal and plasma CVD of graphene"@en . . . . . . "3"^^ . "RIV/68378271:_____/14:00436442!RIV15-GA0-68378271" . . . "42" . . "Correlated microscopic characterization by AFM topography, phase and local current imaging with Raman micro-mapping of graphene layers prepared by plasma and thermal CVD techniques reveals different types of defects in the layers and provides explanation for orders of magnitude different electrical conductivities." . . "Correlated microscopic characterization by AFM topography, phase and local current imaging with Raman micro-mapping of graphene layers prepared by plasma and thermal CVD techniques reveals different types of defects in the layers and provides explanation for orders of magnitude different electrical conductivities."@en . "Journal of Materials Chemistry C" . "Hasegawa, M." . . . . . "Microscopically inhomogeneous electronic and material properties arising during thermal and plasma CVD of graphene" . "10.1039/C4TC01818D" . "Ledinsk\u00FD, Martin" .