"Mosnier, J.-P." . "1742-6588" . "3"^^ . "Proch\u00E1zka, I." . . . "RIV/68378271:_____/13:00398548" . . "Krishnamurthy, S." . . "Ku\u017Eel, R." . "[02FBCC892E2F]" . "10.1088/1742-6596/443/1/012018" . "I, P(GAP108/11/0958)" . "Novotn\u00FD, Michal" . . . . "Defect studies of ZnO films prepared by pulsed laser deposition on various substrates" . . "RIV/68378271:_____/13:00398548!RIV14-GA0-68378271" . "ZnO thin films deposited on various substrates were characterized by slow positron implantation spectroscopy (SPIS) combined with X-ray diffraction (XRD). All films studied exhibit wurtzite structure and crystallite size 20-100 nm. The mosaic spread of crystallites is relatively small for the films grown on single crystalline substrates while it is substantial for the film grown on amorphous substrate. SPIS investigations revealed that ZnO films deposited on single crystalline substrates exhibit significantly higher density of defects than the film deposited on amorphous substrate. This is most probably due to a higher density of misfit dislocations, which compensate for the lattice mismatch between the film and the substrate." . . "4"^^ . "IOP Publishing Ltd" . "Defect studies of ZnO films prepared by pulsed laser deposition on various substrates"@en . "Lan\u010Dok, J\u00E1n" . . . "000321739400018" . "Bristol" . . "ICPA 2012 - 16th International Conference on Positron Annihilation" . "68144" . "Bristol" . "Brauer, G." . "2012-08-19+02:00"^^ . "Defect studies of ZnO films prepared by pulsed laser deposition on various substrates" . "ZnO thin film; pulsed laser deposition; point defects; slow positron implantation spectroscopy; x-ray diffraction"@en . "Connolly, J." . "Melikhova, O." . "McCarthy, E." . . . . . "ZnO thin films deposited on various substrates were characterized by slow positron implantation spectroscopy (SPIS) combined with X-ray diffraction (XRD). All films studied exhibit wurtzite structure and crystallite size 20-100 nm. The mosaic spread of crystallites is relatively small for the films grown on single crystalline substrates while it is substantial for the film grown on amorphous substrate. SPIS investigations revealed that ZnO films deposited on single crystalline substrates exhibit significantly higher density of defects than the film deposited on amorphous substrate. This is most probably due to a higher density of misfit dislocations, which compensate for the lattice mismatch between the film and the substrate."@en . "Bul\u00ED\u0159, Ji\u0159\u00ED" . "Anwand, W." . "Defect studies of ZnO films prepared by pulsed laser deposition on various substrates"@en . . . "\u010C\u00ED\u017Eek, J." . . . "13"^^ . . .