. "Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon. Various types of conductive tips in atomic force microscope (AFM) are used to localize field-enhanced metal-induced solid phase crystallization (FE-MISPC) of amorphous silicon at room temperature down to nanoscale dimensions."@en . "285689" . "6"^^ . . . . "Ko\u010Dka, Jan" . "Verveniotis, Elisseos" . "21" . . "amorphous materials; atomic force microscopy (AFM); conductivity; crystallization; nanostructures; silicon; nickel"@en . "Verveniotis, Elisseos" . "518" . . "P(GD202/09/H041), P(KAN400100701), P(LC06040), P(LC510), Z(AV0Z10100521)" . . "Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon" . "Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon"@en . . "Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon"@en . "Stuchl\u00EDk, Ji\u0159\u00ED" . . "RIV/68378271:_____/10:00354945!RIV11-GA0-68378271" . "Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon" . . . "RIV/68378271:_____/10:00354945" . . "[5F9C92AD3B2A]" . . "Rezek, Bohuslav" . "5"^^ . "Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon. Various types of conductive tips in atomic force microscope (AFM) are used to localize field-enhanced metal-induced solid phase crystallization (FE-MISPC) of amorphous silicon at room temperature down to nanoscale dimensions." . . "0040-6090" . . "5"^^ . . . . "000280989100016" . . . . . "\u0160\u00EDpek, Emil" . . "Thin Solid Films" . . "CH - \u0160v\u00FDcarsk\u00E1 konfederace" . . . .