"P(GD202/05/H003), P(IAA1010316), P(IAA1010413), P(LC06040), P(LC510), P(SN/3/172/05), Z(AV0Z10100521)" . . "Rezek, Bohuslav" . "DE - Spolkov\u00E1 republika N\u011Bmecko" . "RIV/68378271:_____/08:00341951" . "C-AFM and X-TEM: studies of mixed-phase silicon thin films"@en . "32"^^ . "C-AFM and X-TEM: studies of mixed-phase silicon thin films" . . . . "[642B68B9CD78]" . . . "Thin intrinsic silicon films containing microcrystalline grains embedded in amorphous tissue were studied by two complementary microscopy techniques." . . "C-AFM and X-TEM: studies of mixed-phase silicon thin films"@en . "Fejfar, Anton\u00EDn" . "RIV/68378271:_____/08:00341951!RIV10-MZP-68378271" . "C-AFM and X-TEM: studies of mixed-phase silicon thin films" . . "Mates, Tom\u00E1\u0161" . "1439-4243" . "358712" . . "Thin intrinsic silicon films containing microcrystalline grains embedded in amorphous tissue were studied by two complementary microscopy techniques."@en . "G.I.T. Imaging and Microscopy" . . "7"^^ . . . "Ko\u010Dka, Jan" . . . "Schropp, R. E. I." . . "Bronsveld, P. C. P." . "conductive atomic force microscopy; cross-sectional transmission electron microscopy; silicon thin films"@en . "1" . "10" . . "4"^^ . . . . "Rath, J. K." . . . . . . .