. "1098-0121" . "[B387AAE94970]" . . "REELS; Yubero-Tougaard theory; dielectric function; nanofilms"@en . "Spektroskopie ztr\u00E1t energie elektron\u016F (REELS) je pro n\u00EDzk\u00E9 energie velmi povrchov\u011B citliv\u00E1 a m\u016F\u017Ee b\u00FDt pou\u017Eita k charakterizaci elektronov\u00FDch vlastnost\u00ED ultratenk\u00FDch vrstev a nanostruktur na povr\u0161\u00EDch. Abychom z\u00EDskali spolehliv\u00E9 kvantitativn\u00ED informace z nam\u011B\u0159en\u00FDch REELS spekter, mus\u00EDme pou\u017E\u00EDt p\u0159esn\u00FD teoretick\u00FD algoritmus. V tomto \u010Dl\u00E1nku ov\u011B\u0159ujeme platnost teoretick\u00E9 metody navr\u017Een\u00E9 Yuberem a Tougaardem k ur\u010Den\u00ED dielektrick\u00E9 funkce."@cs . . "RIV/68378271:_____/08:00312426" . "Romanyuk, Olexandr" . "2"^^ . "US - Spojen\u00E9 st\u00E1ty americk\u00E9" . . . "Physical Review. B" . "Platnost teorie Yubera a Tougaarda pro kvantitativn\u00ED stanoven\u00ED dielektrick\u00FDch vlastnost\u00ED povrchov\u00FDch vrstev nanometrick\u00FDch rozm\u011Br\u016F"@cs . "Platnost teorie Yubera a Tougaarda pro kvantitativn\u00ED stanoven\u00ED dielektrick\u00FDch vlastnost\u00ED povrchov\u00FDch vrstev nanometrick\u00FDch rozm\u011Br\u016F"@cs . "77" . "Tougaard, S." . "Reflection electron energy-loss spectroscopy (REELS) at low energies is very surface sensitive and can be used to characterize the electronic properties of ultrathin films and surface nanostructures. To extract reliable quantitative information from a REELS experiment it is essential to have accurate theoretical algorithms. In this paper, we have studied the validity of a theoretical method proposed by Yubero and Tougaard to determine the dielectric function." . "Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms"@en . . "000255457400101" . . "Zemek, Josef" . "402235" . "Reflection electron energy-loss spectroscopy (REELS) at low energies is very surface sensitive and can be used to characterize the electronic properties of ultrathin films and surface nanostructures. To extract reliable quantitative information from a REELS experiment it is essential to have accurate theoretical algorithms. In this paper, we have studied the validity of a theoretical method proposed by Yubero and Tougaard to determine the dielectric function."@en . "Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms" . . . "Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms" . "RIV/68378271:_____/08:00312426!RIV09-AV0-68378271" . . "11"^^ . "Hajati, S." . . . "15" . . . . "P(GA202/06/0459), Z(AV0Z10100521)" . . . "Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms"@en . "Romanyuk, Olexandr" . "4"^^ . .