"Hiklov\u00E1, Helena" . . . "6"^^ . "[897F87FF9AFD]" . . "Vojt\u011Bchovsk\u00E1, J." . "5"^^ . "M\u011B\u0159en\u00ED drsnosti povrchu k\u0159em\u00EDkov\u00FDch ingot\u016F po squarov\u00E1n\u00ED"@cs . "Roughness measurement of silicon ingot surfaces after squaring with SQM 2800.0 THEMIS machine" . "498015" . . . . "Schov\u00E1nek, Petr" . "3"^^ . . "P(1M06002), Z(AV0Z10100522), Z(MSM6198959213)" . "SILICON 2006" . . "RIV/68378271:_____/06:00079494!RIV07-AV0-68378271" . "Surface topography has great importance in specifying quality of a surface. A significant proportion of component failure starts at the surface due to either an isolated manufacturing discontinuity or gradual deterioration of the surface quality. The most important parameter describing surface integrity is surface roughness. In the manufacturing industry, surface must be within certain limits of roughness." . . . . . "Roughness measurement of silicon ingot surfaces after squaring with SQM 2800.0 THEMIS machine"@en . "Topografie povrchu m\u00E1 velk\u00FD vliv na specifikaci jeho kvality. Jedna z podstatn\u00FDch vlastnost\u00ED popisuj\u00EDc\u00EDch povrch je drsnost povrchu. Kontrola parametr\u016F drsnosti po squarov\u00E1n\u00ED Si ingot\u016F je hlavn\u00EDm p\u0159edm\u011Btem p\u0159\u00EDsp\u011Bvku."@cs . . . . . . "2006-11-07+01:00"^^ . "Surface topography has great importance in specifying quality of a surface. A significant proportion of component failure starts at the surface due to either an isolated manufacturing discontinuity or gradual deterioration of the surface quality. The most important parameter describing surface integrity is surface roughness. In the manufacturing industry, surface must be within certain limits of roughness."@en . "Ro\u017Enov pod Radho\u0161t\u011Bm" . "M\u011B\u0159en\u00ED drsnosti povrchu k\u0159em\u00EDkov\u00FDch ingot\u016F po squarov\u00E1n\u00ED"@cs . "Ro\u017Enov pod Radho\u0161t\u011Bm" . . "Vojt\u011Bchovsk\u00FD, K." . "RIV/68378271:_____/06:00079494" . "80-239-7781-4" . "TECON Scientific" . "Havelkov\u00E1, Martina" . . . "Roughness measurement of silicon ingot surfaces after squaring with SQM 2800.0 THEMIS machine"@en . "Roughness measurement of silicon ingot surfaces after squaring with SQM 2800.0 THEMIS machine" . "202;207" . . "roughness; squaring; Talysurf"@en .