. "http://www.isvav.cz/h09/resultDetail.do?rowId=RIV%2F68378271%3A_____%2F06%3A00041140!RIV07-AV0-68378271"^^ . "Real topography, atomic relaxations and short-range chemical interactions in atomic force microscopy: the case of the -Sn/Si(111)-(3 x 3) R30 surface," . "67.146000000000000796"^^ . "67.146"^^ . . . "RIV/68378271:_____/06:00041140" . "4455F9EF735E9B90AC1A8557688409EA26818835" . "Real topography, atomic relaxations and short-range chemical interactions in atomic force microscopy: the case of the \u03B1-Sn/Si(111)-(root 3 x root 3) R30 degrees surface," . "http://www.isvav.cz/h09/resultDetail.do?rowId=RIV%2F68378271%3A_____%2F06%3A00041140!RIV07-MSM-68378271"^^ . . . . "01E24A1D7C1EC746E6B925F8BFC9ED5A712B1731" . "Metodika hodnocen\u00ED, rok uplatn\u011Bn\u00ED do 2007 v\u010Detn\u011B, J_imp \u010Dl\u00E1nek v impaktovan\u00E9m \u010Dasopise." . "1"^^ . . .