. "Detailn\u00ED studium struktury n\u00EDzkoteplotn\u00EDch Si vrstev se sm\u00ED\u0161enou strukturou pomoc\u00ED X-TEM a atmosf\u00E9rick\u00E9ho vodivostn\u00EDho AFM"@cs . "Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM"@en . . "RIV/68378271:_____/06:00040682" . "Mates, Tom\u00E1\u0161" . "RIV/68378271:_____/06:00040682!RIV07-AV0-68378271" . "470996" . . "Rath, J. K." . "Journal of Non-Crystalline Solids" . . "Rezek, Bohuslav" . . "silicon; solar cells; plasma deposition; atomic force and scanning tunneling microscopy; TEM/STEM"@en . . "Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM" . . "-" . "Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM" . "We have succeeded in the measurement of local conductivity of thin Si films under standard ambient conditions, overcoming the surface native oxide by more sensitive (pA range) current detection and we also observed the columnar structure of the amorphous phase both by TEM and AFM" . "[6234FBB2A03F]" . . "4"^^ . "Schropp, R. E. I." . . . . . . . "Poda\u0159ilo se n\u00E1m prov\u00E9st m\u011B\u0159en\u00ED lok\u00E1ln\u00ED vodivosti tenk\u00FDch Si vrstev za standardn\u00EDch atmosf\u00E9rick\u00FDch podm\u00EDnek, kdy\u017E p\u0159\u00EDtomnost povrchov\u00E9 vrstvy p\u0159irozen\u00E9ho oxidu byla p\u0159ekon\u00E1na citliv\u011Bj\u0161\u00ED detekc\u00ED proudu (pA rozsah) a tak\u00E9 jsme mozorovali sloupcovou strukturu amorfn\u00ED f\u00E1ze jak pomoc\u00ED TEM, tak AFM"@cs . . "We have succeeded in the measurement of local conductivity of thin Si films under standard ambient conditions, overcoming the surface native oxide by more sensitive (pA range) current detection and we also observed the columnar structure of the amorphous phase both by TEM and AFM"@en . "Bronsveld, P. C. P." . . . . "Fejfar, Anton\u00EDn" . . . . "7"^^ . . . "1011;1015" . "P(GD202/05/H003), P(IAA1010316), P(IAA1010413), P(SN/3/172/05), Z(AV0Z10100521)" . "NL - Nizozemsko" . "352" . "Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM"@en . "5"^^ . . "Detailn\u00ED studium struktury n\u00EDzkoteplotn\u00EDch Si vrstev se sm\u00ED\u0161enou strukturou pomoc\u00ED X-TEM a atmosf\u00E9rick\u00E9ho vodivostn\u00EDho AFM"@cs . "0022-3093" . . "Ko\u010Dka, Jan" .