"Characterization of mixed phase silicon by Raman spectroscopy"@en . "Fekete, Ladislav" . "352" . "0022-3093" . . "We have examined the common methods for determination of the crystallinity. Crystallinity values obtained from Raman spectra excited by Ar+ laser green line (514.5 nm) for a special sample with a profile of structure from amorphous to fully microcrystalline"@en . "Stuchl\u00EDk, Ji\u0159\u00ED" . "Journal of Non-Crystalline Solids" . "Ko\u010Dka, Jan" . . . . . "Characterization of mixed phase silicon by Raman spectroscopy" . . "6"^^ . . "468404" . "RIV/68378271:_____/06:00040680!RIV07-AV0-68378271" . "[E9B2A4A250AD]" . . "RIV/68378271:_____/06:00040680" . . "6"^^ . "Characterization of mixed phase silicon by Raman spectroscopy"@en . "1209;1212" . "-" . "Characterization of mixed phase silicon by Raman spectroscopy" . . . . . "NL - Nizozemsko" . . . . "Fejfar, Anton\u00EDn" . "P(GD202/05/H003), P(SM/300/1/03), P(SN/3/172/05), Z(AV0Z10100521)" . . . "Ledinsk\u00FD, Martin" . . "Charakterizace sm\u011Bsn\u00E9 f\u00E1ze k\u0159em\u00EDku pomoc\u00ED Ramanovy spektroskopie"@cs . "Charakterizace sm\u011Bsn\u00E9 f\u00E1ze k\u0159em\u00EDku pomoc\u00ED Ramanovy spektroskopie"@cs . "We have examined the common methods for determination of the crystallinity. Crystallinity values obtained from Raman spectra excited by Ar+ laser green line (514.5 nm) for a special sample with a profile of structure from amorphous to fully microcrystalline" . "Mates, Tom\u00E1\u0161" . . . . "4"^^ . "silicon Raman scattering; atomic force and scanning tunneling microscopy"@en . "Pr\u00E1ce se v\u011Bnuje ov\u011B\u0159en\u00ED hodnot krystalinity z Ramanovsk\u00E9 spektroskopie a popisuje \u00FAskal\u00ED m\u011B\u0159en\u00ED p\u0159i standardn\u00EDm buzen\u00ED 514.5 nm"@cs . .