. . . "1"^^ . . "Pavl\u00ED\u010Dek, Pavel" . . "Height profile measurement by means of white-light interferometry." . . "[9501EA10DF47]" . "RIV/68378271:_____/03:02030180!RIV/2004/AV0/A02004/N" . "0"^^ . "2003-05-12+02:00"^^ . "1"^^ . "0"^^ . "Height profile measurement by means of white-light interferometry."@en . . "White-light interferometry is an established method for the height-profile measurement of rough surface. we show the results of the heigh-profile measurement of silicon waters."@en . . "Height profile measurement by means of white-light interferometry." . . "\u00DAstav teoretick\u00E9 a aplikovan\u00E9 mechaniky AV \u010CR" . "White-light interferometry is an established method for the height-profile measurement of rough surface. we show the results of the heigh-profile measurement of silicon waters." . . "608725" . . . "Height profile measurement by means of white-light interferometry."@en . "P(LN00A015), Z(AV0Z1010914), Z(AV0Z1010921)" . "\u017Dd'\u00E1r nad S\u00E1zavou" . . "7"^^ . "1;7" . "white-light interferometry; height profile measurement; rough surface"@en . . . . . "RIV/68378271:_____/03:02030180" . . "Engineering Mechanics 2003." . "Svratka [CZ]" . .